Agilent Technologies 8133A Instrukcja Obsługi Strona 37
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Testing Performance 3
16800 Series Portable Logic Analyzers Service Guide 37
Set Up the Test Equipment
1 Turn on the required test equipment. Let all of the test
equipment and the logic analyzer warm up for 30 minutes
before beginning any test.
2 Set up the pulse generator according to the following
table.
a Set the frequency of the pulse generator. In this test
procedure, the logic analyzer uses both edges of the
clock to acquire data. The test frequency is half the
test clock rate because data is acquired on both the
rising edge and the falling edge of the clock. Set the
frequency to 125 MHz plus the frequency uncertainty
of the pulse generator, plus a test margin of 1%.
For example, if you are using an 8133A pulse
generator, the frequency accuracy is ±1% of setting. Use
a test margin of 1%. Set the frequency to 125 MHz plus
2% (127.5 MHz).
b Set the rest of the pulse generator parameters to the
values shown in the following table.
3 Set up the oscilloscope.
a Set up the oscilloscope according to the following
tables.
Table 10 Pulse Generator Setup
Timebase Pulse Channel 2 Trigger Pulse Channel 1
Mode: Int Mode: Pulse ÷ 1 Disable (LED on) Mode: Square
Freq: 125 MHz
plus frequency
uncertainty of
pulse generator
plus 1% test
margin.
Delay: (not available in pulse mode) Delay: 0 ps
Width: Initially set to 1.5 ns. Change
later (on page 43).
Width: (not available in square
mode)
Ampl: 0.6 V Ampl: 0.6 V
Offs: 1.0 V Offs: 1.0 V
Output: Enable (LED off) Output: Enable (LED off)
Comp: Normal (LED off) Comp: Normal (LED off)
Limit: Off (LED off) Limit: Off (LED off)
Output
: Enable (LED off) Output: Enable (LED off)
- Agilent 16800 Series 1
- Portable Logic Analyzers 1
- Model Comparison 3
- Features, Logic Acquisition 3
- Features, Mainframe 4
- Features, Pattern Generator 4
- Supplied Accessories 4
- Optional Accessories: 4
- Service Strategy 4
- In this Service Guide 6
- 4 Calibrating and Adjusting 8
- 7 Replaceable Parts 10
- 8 Theory of Operation 10
- Contents 11
- General Information 13
- Accessories 14
- Specifications 15
- Characteristics 16
- Non-Operating Environment 17
- Dimensions 18
- Recommended Test Equipment 19
- 1 General Information 20
- Preparing for Use 21
- To inspect the logic analyzer 22
- To apply power 22
- To clean the instrument 23
- To start the user interface 23
- To test the logic analyzer 23
- 2 Preparing for Use 24
- Testing Performance 25
- To perform the power-up tests 26
- Logic Analyzer Test Strategy 27
- 3 Testing Performance 28
- Testing Performance 3 31
- Equipment Required 34
- Perform System Self-Tests 36
- Set Up the Test Equipment 37
- Connect the Test Equipment 39
- Deskew the oscilloscope 42
- Set the 8133A pulse width 43
- Configure the Logic Analyzer 45
- Run eye finder 49
- To re-align a stray channel 50
- Test Pod 1 in 250 Mb/s Mode 52
- Test Pod 2 in 250 Mb/s Mode 57
- Test the remaining pods 59
- Test Pod 1 in 500 Mb/s Mode 60
- Test Pod 2 in 500 Mb/s Mode 64
- Conclude the State Mode Tests 66
- Performance Test Record 68
- Calibrating and Adjusting 69
- Calibration Strategy 70
- Troubleshooting 71
- Try , and then 75
- Power Supplies 84
- To run the self-tests 88
- Bit#: 39 - 16 15 - 8 7 - 0 92
- Clock Test 93
- Simple RAM Test 93
- RAM Persistence Test 94
- Marching Bits RAM Test 94
- Wait Test 94
- Instruction Interrupt Test 95
- To exit the test system 96
- 5 Troubleshooting 100
- Set up the test equipment 101
- Connect the test equipment 101
- Threshold 102
- Troubleshooting 5 109
- Clock Frequency of 100 MHz 111
- Click Run Rep 111
- Replacing Assemblies 113
- Replacement Strategy 114
- Tools Required 114
- To save the license file 115
- To power off the system 116
- Replacing Assemblies 6 117
- 6 Replacing Assemblies 118
- 600 watt power supply 119
- Secondary power supply 120
- 60 mm fan 144
- 92 mm fans 145
- Returning Assemblies 148
- FRAGILE 149
- Replaceable Parts 151
- Ordering Replaceable Parts 152
- System Replaceable Parts List 155
- Replaceable Parts 7 159
- • A — Assembly 163
- • MP — Mechanical Part 163
- • W — Cable 163
- Theory of Operation 167
- System Block Level Theory 168
- Module Interface Board (MIB) 169
- CPU Subsystem 170
- PCI board 171
- MIB (Module Interface Board) 171
- Module Bus FPGA(s) 172
- I/O FPGA 172
- Theory of Operation 8 173
- Front Panel Assembly 174
- Power Up Routine 175
- Product install 178
- Software recovery methods 178
- Self Test 179
- Comparators 181
- Acquisition IC 181
- Master/Expander Connectors 182
- Instruction Memory 183
- Data Memory 183
- Output Driver 184
- Clock Circuit 184
- CPU Interface 184
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