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Optimizing the mask testing speed
The mask testing speed can vary with different setups of the oscilloscope and
the size of the test region.
Proper oscilloscope setup
Certain features in the oscilloscope slow down the mask testing speed
considerably. For maximum testing speed, the following settings should be
avoided:
Averaging.
Time base vernier with time base settings at 1 µs/div or faster.
Time base at 2 ns/div.
Horizontal test region
In a lot of cases, you are only interesting in testing a part of a waveform. For
example, you do not need to test the full cycle of a waveform to test the
overshoot of the waveform. In these cases, the mask can be defined so that
only the portion that is required is tested. The testing speed is generally
proportional to the number of points tested. Refer to the section "To edit the
mask to test only a portion of a waveform" in chapter 2 for information on
how to create the selectable test region.
Solutions
Optimizing the mask testing speed
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