Agilent Technologies HP 54601B Podręcznik Użytkownika Pobierz pdf (Strona 68)

Creating an overshoot testing mask

There are two parameters associated with the overshoot of a signal: the

percentage of overshoot and the settling time of the overshoot. A mask

template can be created to test the upper limit of these two parameters at

the same time. Figure 14 shows an example of a mask template for testing

overshoot.

Example of a mask template for testing overshoot

The critical factors for creating the mask template are:

•

To optimize testing speed, the information on the signal before the rising

edge should not be tested since it is not required for overshoot testing.

•

The vertical window of the middle region of the mask template determines

the upper limit of the overshoot.

•

The horizontal window of the middle region determines the upper limit of

the settling time.

•

The vertical window of the rightmost region determines the settling

window. Normally, the settling window is ±5% or ±10% of the

V top voltage.

Figure 14

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Creating an overshoot testing mask

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Agilent Technologies HP 54601B Podręcznik Użytkownika Strona 68