Agilent Technologies HP 54601B Podręcznik Użytkownika Pobierz pdf (Strona 64)

Creating a frequency testing mask

A mask can be used to test the frequency of the input signal. The shape of

the mask varies depending on the shape of the signal to be tested. A mask

designed for testing a sine wave cannot be used to test a square wave.

Different masks are needed for different shapes of signals. Using the

calibrated vertical vernier, position, and time base of the HP 54600-series

oscilloscope, a mask can be reused to test signals of similar shapes but

different frequencies and amplitudes.

To test the frequency of the signal, the period of the signal is tested instead

of actually measuring the frequency. The test can be conducted by triggering

on an edge of the signal and testing for the location of the second edge. An

example mask is shown in the following figure.

Example mask for testing the frequency of a sine wave

Figure 12

Solutions

Creating a frequency testing mask

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Agilent Technologies HP 54601B Podręcznik Użytkownika Strona 64