Agilent Technologies Agilent 8164A Podręcznik Użytkownika Strona 143
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Optional Performance Tests Performance Tests
Agilent 81600B Tunable Laser Source Family, Fourth Edition 143
34 Compute the average of the previous results over all scans:
A
AVG
= sum[A(*)] / n
R
AVG
= sum[R(*)] / n
35 The Dynamic Relative Wavelength Uncertainty (see Definition of
Terms) is given as ±R
AVG
36 The Dynamic Absolute Wavelength Uncertainty (see Definition of
Terms) is given as ±A
AVG
Test limits: Dynamic Absolute and Relative Wavelength Uncertainty are not
guaranteed specifications but charactereristics with typical performance.
Nevertheless, the test would ask for test limits within which the product
can be assumed to perform well.
The test limits of the mentioned parameters use the add-on difference
between the dynamic parameters and the static parameters, and add this
add-on value to the guaranteed specification of the static parameter.
For Example, Absolute Wavelength Accuracy 81600B #200:
Dynamic characteristic (at 5nm/s): ±4.0 pm (typical)
Static characteristic: ±3.6 pm (typical)
Add-on value (dynamic - static characteristic): ± 0.4 pm (typical)
Static specification: ±10 pm
Test limits: ±10.4 pm
- Agilent 81600B 1
- User’s Guide 1
- In This Guide 4
- Table of Contents 5
- Specifications 33 6
- Performance Tests 71 7
- Index 269 8
- List of Figures 9
- Tunable Laser Source Family 11
- General Safety Considerations 12
- Line Power Requirements 13
- Operating Environment 13
- Initial Inspection 13
- Input/Output Signals 14
- Storage and Shipment 14
- Agilent 81600B family modules 15
- Laser Safety Labels 16
- What is a Tunable Laser? 17
- Front Panels 18
- Typical Use Models 19
- Optical Output 21
- Straight Contact 22
- Connector Symbol 22
- Angled Contact 22
- Signal Input and Output 23
- Accessories 25
- Laser Source Modules and 26
- Option 81600B-072 is highly 27
- Module Options 28
- User’s Guides 29
- Accessories Module Options 30
- Specifications 33
- Definition of Terms 35
- General Definitions 36
- (continuous sweep mode) 38
- Effective linewidth 38
- Linewidth 40
- Maximum output power 40
- Mode-hop free tunability 41
- Output isolation 41
- Polarization extinction ratio 42
- Power linearity 43
- Power repeatability 43
- Power stability 44
- Return loss 46
- Side-mode suppression ratio 46
- (SSE) ratio 46
- Wavelength range 48
- Wavelength resolution 49
- Wavelength stability 50
- Laser Source Module 51
- At constant temperature ±1 K 53
- Conditions 66
- Operating Modes: 68
- Coherence Control: 68
- Output Isolation (typ.): 69
- Return Loss (typ.): 69
- Specifications Conditions 70
- Performance Tests 71
- Required Test Equipment 73
- Test Failure 74
- Instrument Specification 74
- Performance Test Instructions 75
- General test Setup 75
- Environment 75
- Wavelength Tests 76
- Wavelength Accuracy 77
- Mode-Hop Free Tuning 81
- Power Tests 88
- Power Stability 107
- Measurement Principle 112
- ≅1407 nm 117
- Test Procedure 123
- Performance Tests Power Tests 130
- Optional Performance Tests 131
- Dynamic Wavelength Accuracy 135
- Analysis 142
- Normalized Sweep Acceleration 145
- Test Records 146
- Test Record 148
- Test Equipment Used 149
- ________nm 151
- Mode Hop Free Tuning 152
- Wavelength Repeatability 153
- Maximum Power Test 154
- Power Flatness 158
- Wavelength Deviation = Wave 179
- Upper Power Levels 212
- Power Linearity 237
- Safety Precautions 245
- Why is it important to clean 246
- What materials do I need for 247
- Cotton swabs 248
- Soft tissues 248
- Pipe cleaner 249
- Compressed air 249
- Additional Cleaning Equipment 250
- Premoistened cleaning wipes 251
- Polymer film 251
- Infrared Sensor Card 251
- Preserving Connectors 252
- Cleaning Instrument Housings 253
- General Cleaning Procedure 254
- Preferred Procedure 255
- Alternative Procedure 255
- Procedure for Stubborn Dirt 255
- An Alternative Procedure 255
- CAUTIONWARNING 261
- How to clean bare fiber ends 265
- Alternative Procedure A 267
- Alternative Procedure B 267
- Other Cleaning Hints 268
- Agilent Technologies 272
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