Agilent Technologies Agilent 8164A Podręcznik Użytkownika Pobierz pdf (Strona 10)

10 Agilent 81600B Tunable Laser Source Family, Fourth Edition

Figure 39 Test Setup for Total Source Spontaneous Emission Test

- Low SSE output . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 123

Figure 40 Test Setup for Total Source Spontaneous Emission Test

- High Power output . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 131

Figure 41 Test Flow - Dynamic Wavelength Accuracy Measurements . . . . . 136

Figure 42 Setup for wavelength uncertainty verification in swept mode . . . 137

Figure 43 Optimization of reference scans. Sampling points as circled,

threshold in dashed line. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 140

Figure 44 Measurement Setup to Determine the Sweep Speed . . . . . . . . . . . 145

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Agilent Technologies Agilent 8164A Podręcznik Użytkownika Strona 10