Agilent Technologies B2902 Podręcznik Użytkownika Strona 139
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Agilent B2900 User’s Guide, Edition 2 4- 33
Front Panel Reference
Function key group
Fail on=IN judges limit test failure if the channel goes into the
compliance state.
Fail on=OUT judges limit test failure if the channel comes out
of the compliance state.
Fail Pattern Only for compliance check. Bit pattern for the limit test fail
state.
Up Pattern Not available for compliance check. Bit pattern for the
failed-by-exceeding-upper-limit state. Used for the GRADING
mode.
Up Limit Not available for compliance check. Upper limit for the
pass/fail judgement. Used for the GRADING mode.
Low Pattern Only for limit test. Bit pattern for the
failed-by-exceeding-lower-limit state. Used for the GRADING
mode.
Low Limit Only for limit test. Lower limit for the pass/fail judgement.
Used for the GRADING mode.
Bit pattern is sent to the DIO pins specified by the GPIO Pins field on the Composite
Limit Test Setup dialog box.
- Agilent B2900 Series 1
- Precision Source/Measure Unit 3
- Safety Summary 5
- Safety Symbols 7
- Product Stewardship 15
- In This Manual 16
- Contents 17
- 1 Getting Started 25
- D: Dual view 26
- 1: Single view 26
- Applying DC Output 27
- **UDSK9LHZ 31
- Operation Tips 32
- Operation Summary 34
- View key 37
- Getting Started 40
- 2 Introduction 41
- Front View 44
- Rear View 47
- Serial Number 48
- Source/Measure Unit 49
- Measurement Parameters 50
- Limit/Compliance 50
- Output and Measurement Ranges 51
- Specification Conditions 56
- Maximum Voltage and Current 56
- Source Specifications 56
- Measurement Specifications 56
- Pulse peak 60
- Pulse width 60
- Pulse base 60
- Output Characteristics 63
- Resistance Measurement 65
- System Speeds 65
- General Specifications 67
- Front Panel Interface 68
- Easy-to-use Key Operations 68
- Sweep Measurement 70
- Data Buffers 70
- Programming Language 71
- USB File System 71
- Digital I/O Interface 72
- Software and Drivers 73
- Furnished Accessories 74
- Available Accessories 74
- 3 Installation 77
- Inspecting the Shipment 79
- Checking for Errors 80
- Safety Considerations 81
- Environment 81
- Connecting the Power Cord 81
- Bench Installation 82
- Rack Installation 83
- Removing the Bumper 83
- Removing the Handle 83
- Cleaning 84
- Self-test 84
- Self-calibration 85
- Calibration 85
- Connecting a DUT 86
- Floating 88
- Using Test Leads 89
- Using the N1295A Test Fixture 90
- Using the 16442B Test Fixture 91
- 2-wire connections 92
- 4-wire connections 92
- Guarding 94
- $QRGH 96
- &DWKRGH 96
- Installation 97
- GPIB/USB Interfaces 98
- LAN Interface 100
- Connecting to a Site LAN 100
- Modifying the LAN Settings 101
- Communicating Over the LAN 102
- Using Telnet 103
- Using Sockets 103
- Using Digital I/O 105
- 4 Front Panel Reference 107
- Hard Keys and Rotary Knob 109
- Display and Assist Keys 111
- Dual View 112
- Single View 114
- Range parameters 117
- Sweep parameters 118
- Pulse parameters 120
- Trigger parameters 121
- Graph View 123
- Roll View 125
- Status Information 128
- Function Keys 129
- Config key group 130
- Output Connection dialog box 131
- Output Filter dialog box 132
- Sweep dialog box 133
- Ranging dialog box 134
- Wait Control dialog box 135
- Math Expression dialog box 136
- Limit Test Setup dialog box 138
- Trace Buffer Setup dialog box 140
- Trigger key group 141
- Measure Result dialog box 144
- Limit Test Result dialog box 145
- File Selection dialog box 147
- Program key group 148
- I/O key group 149
- Data Output Format 150
- Format (Measure) dialog box 150
- Format (Trace) dialog box 151
- LAN Configuration dialog box 152
- DIO Configuration dialog box 152
- DIO Read/Write dialog box 153
- Display key group 154
- System key group 155
- 5 Front Panel Operations 157
- Starting measurement 158
- Basic Operations 159
- Setting the Power Frequency 161
- Setting the Beeper 162
- Setting the Date and Time 162
- Performing the Self-Test 162
- Displaying the Error Message 163
- Clearing the Error Buffer 163
- Clearing Timestamp 163
- Setting the GPIB Address 164
- Front Panel Operations 165
- Controlling the Source Output 165
- Stopping the Source Output 166
- Setting the Output Range 166
- Setting the Pulse Output 167
- Setting the Sweep Output 168
- Setting the List Sweep Output 169
- Setting the Source Wait Time 170
- Setting the Output Filter 170
- Setting the Connection Type 171
- Protection 172
- Function 173
- Setting the Sweep Direction 174
- Setting the Measurement Mode 176
- Performing Spot Measurement 176
- Stopping Measurement 176
- Setting the Measurement Speed 176
- Setting the Measurement Range 177
- Performing Sweep Measurement 177
- Using the Math Function 181
- Performing the Limit Test 182
- Setting the Trace Buffer 186
- Selecting a Program 188
- 6 Function Details 189
- To Set Compliance 191
- Setting the Ranging Mode 192
- Aperture Time 193
- Overhead Time 193
- Pulse Output 195
- To Set Pulse Output 196
- Sweep Output 197
- List Sweep 198
- Output Filter 199
- Output-Off Status 201
- High Capacitance Mode 203
- Resistance Compensation 204
- Predefined Math Expressions 205
- Limit Test 208
- Function Details 209
- Trace Buffer 211
- Program Memory 213
- Channel Grouping 214
- Trigger Source 215
- ARM Layer 216
- TRIGger Layer 216
- Device Actions 217
- Trigger Output 218
- Synchronous Device Actions 219
- Interlock Function 220
- Over Temperature Protection 221
- Initial Settings 222
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