Agilent Technologies HP 8566B Dokumentacja

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4.5.6.Crystal Filter Bypass Network Configuration . . . . .3-219Option 462Introduction . . . . . . . . . . . . . . . . . . . . .3. 6 dB Resolution Ban

17. Image, Multiple, and Out of Band Responses Test‘I&ble Z-20. Image and Out-of-Rand ResponseSpectrum Analyze][CENTER FREQUENCY]WW369125791r IISy

17. Image, Multiple, and Out of Rand Responses Test9. Repeat steps 4 through 9 for all remaining (CENTER FREQUENCY]and synthesized sweeper settings in

18. Gain Compression Test18. GainCompression WstSpecificationcl.0 dB, 100 Hz to 22 GHz with s-5 dBm at the input mixerDescriptionGain compression is m

18. Gain Compression TestOUTPUT LEVEL RANGE . . . . . . . . . . . . . . . . . . . . . . . . . . . -20 dBmNoteCare should be taken to disturb the cable

18. Gain Compression Test16. Set synthesizer to 3000.000 MHz. Connect cable to power sensorand adjust output level of synthesizer for an indication of

18. Gain Compression Test30. Connect cable to power sensor and adjust output level ofsynthesizer for a power meter indication of -5.00 ho.02 dB.Reconn

19. 1st LO Output Amplitude Test19. 1st LO outputAmplitude TestSpecification> + 5 dBm from 2.3 GHz to 6.1 GHzDescriptionThe power level at the 1ST

20. Sweep + TuneOut Accuracy ListSpecification-1 V/GHz X Center Frequency (GHz) f(2% + 10 mV)DescriptionThe spectrum analyzer is set to zero frequency

20. Sweep + Tune Out Accuracy Test‘able 2-22. Sweep + Tune Out AccuracyCENTERFREQUENCY0 Hz-0.0101MHz-0.01112MHz-0.022130MHz-0.143670MHz-0.6931.3GHz- 1

21. Fast SweepTime AccuracyYLkst (<20 ms)Related AdjustmentNoneSpecificationflO% for sweep times 1100 secondsDescriptionThe triangular wave output

Figuresl-l. Service Accessories, HP Part Number 08566-60001. .2-l. Center Frequency Test Setup...2-2. Center Frequency Accuracy Measurement..

21. Fast Sweep Time Accuracy Test (~20 ms)5. Press MARKER [PEAK SEARCH), (MKR], loFF).6. Set [FREQUENCY SPAN] to 0 Hz, (RES] to 3 MHz, [VlDEoj to 3MHz

21. Fast Sweep Time Accuracy Test (~20 ms)‘Jhble 2-23. Fhst Sweep Time Accuracy (~20 ms)SWEEP TIME] Function Generator Frequency Sweep Time Errorwa(di

22. Frequency Reference Error Test22. FrequencyReference ErrorTestRelated Adjustment10 MHz Standard AdjustmentSpecificationAging Rate: <l X 10mg/da

22. Frequency Reference Error TestElECTRONiC COUNTERFREQUENCYSTANDARDSPECTRUM ANALYZERFigure 2-37. Frequency Reference Test SetupEquipmentElectronic

Table 2-24.Performance TkstRecordHewlett-Packard CompanyModel HP 8566BSerial No.IF-Display SectionRF SectionTested byReport No.DatePerformance Tests 2

Tkst 1. CenterFrequency ReadoutAccuracySynthesizedSweeperFrequency2GHz2GHz2GHz2GHz3GHz3GHz3GHz3GHz6GHz6GHz6GHz6GHz9GHz9GHz9GHz9GHz9GHz12GHz12GHz12GHz1

Test 2. Frequency Span Accuracy TestTest 2. FrequencySpan Accuracy TestStep 7. Narrow Span AccuracySpectrum AnalyzerTFrequency SynthesizerT[FREQUENCYS

Test 3. ResolutionBandwidthAccuracy TestStep 8. Bandwidth Accuracy3 MHz5 MHz1 MHz2 MHz300 kHz500 kHz100 kHz200 kHz30 kHz50 kHz10 kHz20 kHz3 kHz5 kHz1

Test 4. Resolution Bandwidth SelectivityTest 4. ResolutionBandwidthSelectivityStep 9. Resolution Bandwidth SelectivityrSpectrum AnalyzerTESBW)3 MHz1 M

lkst 5. ResolutionBandwidthSwitchingUncertaintyStep 5. Bandwidth Switching Uncertainty:RES-1 MHz3 MHz300 kHz100 kHz30 kHz10 kHz3 kHz1 kHz300 Hz100 Hz3

3-8. Location of AlA Components ...3-9. CRT Cut-Off Voltage3-10. Waveform at AlA3TP5’ : : : : : : : : : : : : 1 : :3-l 1. Discharging the CRT

Test 6. Log Scale Switching Uncertainty Testlkst 6. Log ScaleSwitchingUncertainty TestStep 6. Log Scale Switching UncertaintySCALE MKR Amplitude(dB/DI

‘I&t 7. IF GainUncertaintyStep 12. IF Gain Uncertainty, 10 dB Steps[REFERENCE LEVEL) Frequency (VlDEo] DeviationVWSynthesizer(W(Marker AAmplitudeA

Test 7. IF Gain UncertaintyStep 22. IF Gain Uncertainty, 0.1 dB Steps[REFERENCE LEVEL]Wm)0.0-0.1-0.2-0.3-0.4-0.5-0.6-0.7-0.8-0.9-1.0-1.1-1.2-1.3-1.4-1

Test 7. IF Gain UncertaintySteps 23 through 28.StepsMinMeasured Max23. Recorded deviations from step 12.Largest Positive 0 to -70 dBmLargest Negative

lkst 8. Amplitude Fidelityl&t 8. AmplitudeFidelityStep 6. Log Scale FidelityFrequency1SynthesizerCalibratedAmplitude AmplitudeWWStep+ 100 (ref)0-1

Test 9. CalibratorAmplitudeAccuracyStep 2. CAL OUTPUT LevelMinMeasuredMax1 Cal OUTPUT level I- 10.30 dB 1I-9.70 dB I2-100 Performance Tests

Test 10. Frequency Response TestTest10.FrequencyResponse ‘I&tStep12Min Measured MaxDeviation1kHz to100 kHz1.2 dBStep 18SpectrumAnalyzerSTART STOPm

Test 10. Frequency Response Test‘Bble 2-24. Frequency Response (Flatness)12346Frequent ySpectrum AnalyzerCalTrace LimitsRandandFrequent yFlatnessSynt

Test 11. Sweep Time AccuracyTest 11. SweepTime Accuracy[SWEEP TIME)20ms30ms50ms70ms90ms110ms170ms200ms2sStep 6. Sweep Time Accuracy, Sweep Times 220 m

‘I&t 12. NoiseSidebands lkstSteps11. Noise Sideband Level320 Hz offset16. Noise Sideband Level1 kHz offset2 1. Noise Sideband Level10 kHz offset26

3-56. Sweep and DAC Adjustments Setup...3-1143-57. OV to + 1OV Sweep Ramp at A16TP3...3-1153-58. Location of Sweep and DAC Adjustments...

Test 13. Line-Related SidebandsTkst 13.Line-RelatedSidebndsSteps9. Line-Related Sidebands Levels for 100 MHz signalLargest level ~360 Hz away from sig

‘I&t 14. AverageNoise LevelStepsIMinMeasuredMax8 and 10. Marker Amplitude Readout100 Hz51 kHz-95 dBm-112 dBmStep 11. Average Noise LevelCENTER FRE

Test 15. Residual ResponsesII&t 15. ResidualResponse!Steps8. Residual Responses 0 Hz to 1.5 GHZLargest Residual Level11. Residual Responses 1.4 to

‘I&t16. HarmonicAndIntermodulationDistortionSteps8. Second Harmonic Level of 230 MHz15. Second Harmonic Level of 800 MHz25. Second Harmonic Level

Test 17. Image, Multiple, and Out-of-Rand ResponsesTest 17. Image,Multiple, andOut-of-BandResponsesStep 8. Image and Out-of-Rand ResponseSpectrum Anal

Test 17. Image, Multiple, and Out-of-Rand ResponsesStep 8. Image and Out-of-Rand Response (continued)Spectrum Analyzer[CENTER FREQUENCY]WWSynthesized

Test 18. Gain CompressionWst18.GainCompressionStepsMin14.Gain Compressionfor input -10to0 dBm at 2GHz-1.0dB27. Gain Compressionforinput-15to-5 dBm at3

Test 19. 1st LOOutput AmplitudeStepsMinMeasured Max4. 1st LO OUTPUT Level + 5 dBm2-112 Performance Tests

Test 20. Sweep + Tune Out AccuracyTest 20. Sweep +Tune Out AccuracyStep 3. Sweep + Tune Out AccuracyCENTERFREQUENCY0 Hz1MHz12MHz130MHz670MHz1.3 GHz5.7

‘l&t 21. FastSweep TimeAccuracy (< 20 ms)Step 10. Fhst Sweep Time Accuracy (~20 ms)Function Generator Frequency(W)2.00 f0.025.00 f0.0510.0 fO.1

3-106. Sample and Hold Balance Adjustment Waveforms...3-107. Waveform Before Adjustment...3-108. Low-Noise DC Supply...3-109. Cr

Test 22. Frequency Reference Error TestTest 22. FrequencyReference ErrorT&tStepsI IMinMeasuredI Max I4.Initial Frequency10. MHz5.Frequency after 2

3AdjustmentsIntroductionThe procedures in this section are for the adjustment of theinstrument’s electrical performance characteristics.WarningThe pro

SafetyConsiderationsAlthough this instrument has been designed in accordance withinternational safety standards, this manual contains information,caut

Factory-SelectedComponentsFactory-selected components are identified with an asterisk (*) on theschematic diagram. For most components, the range of t

‘Ihble 3-1. Adjustment Cross ReferenceFunction AdiustedLow VoltageHigh VoltageCRT Display (Standard)CRT Display (Digital Storage)IF GainsLog ScalesBan

‘Ihble 3-2. Adjustable ComponentsReferenceDesignatorAlA2C308AlA2R308AlA2R319AlA2R409AlA2R426AlA2R427AlA2R437AlA2R440AlA2R512AlA2R513AlA2R515AlA2R517Al

‘lhble 3-2. Adjustable Components (continued)tReferenceAdjustmentidjustmenlDesignatolName NumberA3AlR34SWEEP OFFSET25Adjustment FunctionA3A2R12LL THRE

‘Ihble 3-2. Adjustable Components (continued)ReferenceDesignatorA4A4C9AdjustmentNameSYMAdjustmentNumber8A4A4C19LC CTR8A4A4C20CTR 8A4A4C39SYM8A4A4C41LC

ReferenceDesignatorA4A7C42A4A7R30A4A7R4 1A4A8C13A4A8C29A4A8C32A4A8C42A4A8C44A4A8C46A4A8C66A4A8C67A4A8R6A4A8R7A4A8R35A4ASR40A4A9R60A4A9R6 1A4A9R62A4A9R

lfdble 3-2. Adjustable Components (continued)ReferenceDesignatorAGAlORlA6AlOR9A6AlOR12A6AlOR15A6AlOR18A6AlOR21A6AlOR23A6AlOR25A6AlOR27A6AlOR29A6AlOR31

!Ihbles2-l. Performance Test Cross-Reference ...2-2. Center Frequency Readout Accuracy ...2-3. Narrow Span Accuracy...2-4. Wi

ReferenceDesignatorA6A12R82A6A12R83A6A12R84A6A12R85A6A12R98A6A12Rll3A7A2C 1A7A2C2A7A2C3A7A2C4A7A4AlAlClA7A4AlAlC5A8R2AlOAlL7AlOAlL8AlOA3LllAlOA3L12AlO

‘Ihble 3-2. Adjustable Components (continued)ReferenceAdjustmentAdjustment Adjustment FunctionDesignatorName NumberAl lA5ClIMPEDANCE16Optimizes sample

‘Ihble 3-2. Adjustable Components (continued)ReferenceAdjustment AdjustmentAdjustment FunctionDesignatorNameNumberAlA2R31ORTHO3Sets orthogonality of C

‘Ikble 3-3. Fhctory-Selected ComponentsReference Adjustment Range of ValuesFunction of ComponentDesignator Procedure(0 or PF)AlA2R932.87 K to 6.19 KS

‘Ihble 3-3. F&tory-Selected Components (continued)Reference Adjustment Range of ValuesFunction of ComponentDesignator Procedure(0 or PF)A4A3R741.7

‘Ihble 3-3. Factory-Selected Components (continued)ReferenceDesignatorA4A7R34A4A7R35A4A7R45A4A7R46A4A7R56A4A7R57A4A7R60A4A7R66A4A7R68A4A7R70A4A7R72A4A

‘Ihble 3-3. Fhctory-Selected Components (continued)ReferenceDesignatorA4A8R19A4A8R24A4A8R26A4A8R29A4A8R30A4A8R34A4A8R36A4A8R36A4A8R52A4A8R55A4A9R3A4A

‘Ibble 3-3. F&tory-Selected Components (continued)ReferenceDesignatolA6A9AlR5A6A9AlRlfA6A9AlR2;A6AlOR86A6AlOR87A6AlOR88A6AlOR89A6AlOR90A6AlOR91A6A

Table 3-3. Fhctory-Selected Components (continued)Reference Adjustment Range of Values Function of ComponentDesignator Procedure(0 or PF)Al lA4R24348

able 3-3. Factory-Selected Components (continued)Reference Adjustment Range of ValuesDesignator Procedure(0 or PF)Function of ComponentOption 462A4A7R

3-19. Crystal Filter Bypass Network Configuration for A4A7(3MHz) . . . . . . . . . . . . . . . . . . . . .4-l. 6 dB Resolution Bandwidth Accuracy . .

‘Ihble 3-4. Standard Value Replacement CapacitorsrCaoacitorssType: TubularRange: 1 to 24 pFI’olerance: 1 to 9.1 pF = f0.25 pF10 to 24 DF = f5%V&he

‘Ihble 3-5.Standard Value Replacement 0.125 ResistorsResistorsType: Fixed-FilmRange: 10 to 464K OhmsWattage: 0.125 at 125°CTolerance: f 1 .O%Value (fl

‘Ihble 3-5.Standard Value Replacement 0.125 Resistors(continued)ResistorsType: Fixed-FilmRange: 10 to 464K OhmsWattage: 0.125 at 125°ClbleranValue (0)

‘able 3-6. Standard Value Replacement 0.5 ResistorsResistorsType: Fixed-FilmRange: 10 to 1.47M OhmsValue (Q:WattTO1EP Part Numberan5-fl.O%Value (fl:El

‘able 3-6.Standard Value Replacement 0.5 Resistors(continued)ResistorsType: Fixed-FilmRange: 10 to 1.47M OhmsWattage: 0.5 at 125°CValue (ff16.2K17.8K1

1. Low-Voltage Power Supply Adjustments1. Low-VoltagePower SupplyAdjustmentsReferenceIF-Display Section:AlA f15 V RegulatorAlA + 120 V, +5.2 V Regulat

1. Low-Voltage Power Supply AdjustmentsProcedureIF-Display Section1. Position the instrument on its right side with the IF-DisplaySection facing right

1. Low-Voltage Power Supply AdjustmentsAlAGDSlAlA6TP3AlAGR9AlA6DS2/AlA7TP2, AlA7DSlAlA8DSl/’ AlA7DS2i AlA7TP3Figure 3-3.IF-Display Section Adjustments

1. Low-Voltage Power Supply AdjustmentsRF Section11. With the LINE switch still ON, the RF Section’s +22 V indicatorA8DSl (yellow LED) should be lit.

1General InformationIntroductionThis HP 8566B Tests and Adjustments Manual contains two mainsections: Performance Tests and Adjustments Procedures. Th

1. Low-Voltage Power Supply Adjustments24. Connect the DVM to A18TP4. The DVM indication should be-10.0 3~0.1 V dc. The -10 V supply is referenced to

2. High-Voltage Adjustment (SN 3001A and Below)2. High-VoltageAdjustment (SN3001A and Below)NoteNoteReferenceThis procedure is for IF-Display Sections

2. High-Voltage Adjustment (SN 3001A and Below)DIGITIZINGDSCI LLOSCDPEDIGITAL VDLTMTERHI-VDLTAGESIGNAL ANALYZERFigure 3-5. High Voltage Adjustment Set

Warning2. High-Voltage Adjustment (SN 3001A and Below)be performed with the DVM manually set to the 100 V range (*OO.OOOon the HP 3456A display).AlA H

2. High-Voltage Adjustment (SN 3001A and Below)10. Wait at least one minute for capacitors to discharge to a safelevel.11. Remove the protective cover

2. High-Voltage Adjustment (SN 3001A and Below)stabilize and the CRT to normalize. This so$ turn-on will extendCRT life expectancy, particularly if a

2. High-Voltage Adjustment (SN 3001A and Below)then set the LINE switch to ON (the INSTR CHECK I LED willlight.)30. Wait approximately 30 seconds for

2. High-Voltage Adjustment (SN 3001A and Below)i ..___ -_.- ..~...~. - ._.. i .._... - .._...--..

2. High-Voltage Adjustment (SN 3001A and Below)12 VP+, whichever is greater. See Figure 3-10. (The value of V,,was recorded in step 34.)If the front-p

2. High-Voltage Adjustment (SN 3001A and Below)41. The High-Voltage Adjustment is completed. If an AlA2, AlA4,or AlA assembly has been repaired or rep

Instruments CoveredThis manual contains procedures for testing and adjusting HPby this Manual8566B spectrum analyzers, including those with Option 400

2. High-Voltage Adjustment (SN 3001A and Below)4. Connect a jumper wire (insulated wire and two alligator clips)between the shaft of a small screwdriv

2. High-Voltage Adjustment (SN 3004A and Above)2. High-VoltageAdjustment (SN3004A and Above)NoteNoteReferenceDescriptionWarningThis procedure is for I

2. High-Voltage Adjustment (SN 3004A and Above)EquipmentHigh-VoltageAdjustment ProcedureWarningWarningDigital Voltmeter (DVM)...

2. High-Voltage Adjustment (SN 3004A and Above)AlA HIGHVOLTAGEREGULATORAlA8DSlAlA7TP3AlA6R103Figure 3-13. Location of High Voltage Adjustments4. Set t

2. High-Voltage Adjustment (SN 3004A and Above)11. Remove the protective cover from the AlA High-VoltageRegulator Assembly. A label should be visible

2. High-Voltage Adjustment (SN 3004A and Above)CRT life expectancy, particularly if a new CRT has just beeninstalled.17. Readjust AlA6R103 HV ADJ for

2. High-Voltage Adjustment (SN 3004A and Above)Discharge ProcedureThe High-Voltage Adjustment procedure does not require the removalfor High Voltage a

2. High-Voltage Adjustment (SN 3004A and Above)GroundingWireFigure 3-15. Discharging the CRT Post-Accelerator CableNoteA small bracket and screw secur

3. PreliminaryDisplayAdjustments (SN3001A and Below)ReferenceNoteNoteDescriptionCautionEquipmentAlAl KeyboardAlA Z-Axis AmplifierAlA X-Deflection Ampl

3. Preliminary Display Adjustments (SN 3001A and Below)ProcedureX and Y Deflection1. Connect a 10: 1 (10 MQ) divider probe to the oscilloscope’s chann

‘lhble l-l. Recommended Test Equipment (1 of 6)InstrumenlSIGNALSOURCESSynthesizedSweeperSynthesizedSignalGeneratorFrequencySynthesizerPulseGeneratorFu

3. Preliminary Display Adjustments (SN 3001A and Below)AlAAlAAtA/ A3A2Figure 3-17. Location of AlA2, AlA4, AlA5, and A3A2~ooooooooooooooorAlALR22IYTHf

3. Preliminary Display Adjustments (SN 3001A and Below)12. Set the oscilloscope controls as follows:Press(CHAN]:Channel 1...

3. Preliminary Display Adjustments (SN 3001A and Below)the combined X deflection voltage applied to the CRT. Use theoscilloscope front-panel knob to a

3. Preliminary Display Adjustments (SN 3001A and Below)OVERSHOOTOVERSHOOlFigure 3-2 1.Rise and Fall Times and Overshoot Adjustment Waveform19. Connect

3. Preliminary Display Adjustments (SN 3001A and Below)NoteThe pulse/function generator output must be terminated with 50ohms. Use a BNC tee, a 509 te

3. Preliminary Display Adjustments (SN 3001A and Below)32. Use the oscilloscope [@iGJ markers to measure the risetime,falltime, and percent overshoot

3. PreliminaryDisplayAdjustments (SN3004A and Above)ReferenceNoteNoteDescriptionCautionEquipmentAlAl KeyboardAlA X, Y, Z Axis AmplifierAdjustment Proc

3. Preliminary Display Adjustments (SN 3004A and Above)ProcedureX and Y Deflection1. Connect a 10: 1 (10 Ma) divider probe to the oscilloscope’s chann

3. Preliminary Display Adjustments (SN 3004A and Above)A3A2A3AlFigure 3-24. Location of AlA and A3A2TP501R127 R120 Cl09 TP105 R227C204R220R217JSGNDc30

3. Preliminary Display Adjustments (SN 3004A and Above)12. Set the oscilloscope controls as follows:Press m):Channel 1 . . . . . . . . . . . . . . . .

Performance Tests andAdjustments ManualHP 8566B Spectrum AnalyzerF!aHEWLETTPACKARDHP Part No. 08566-90168Printed in USA September 1993

‘able l-l. Recommended Test Equipment (2 of 6)InstrumentANALYZERSSpectrumAnalyzerActive ProbeProbe PowerSUPPIYHigh FrequencyActive ProbeCOUNTERSFreque

3. Preliminary Display Adjustments (SN 3004A and Above)the combined X deflection voltage applied to the CRT. Use theoscilloscope front-panel knob to a

19.20.Pulse Response of 21.Control Gate ZAmplifier to BLANKInput 22.23.Disconnect the oscilloscope channel 4 probe from the spectrumanalyzer. Connect

3. Preliminary Display Adjustments (SN 3004A and Above)29. Set the oscilloscope controls as follows:Press(ZiZi):Channel 1 . . . . . . . . . . . . . .

4. Final Display Adjustments (SN 3001A and Below)4. Final DisplayAdjustments (SN3001A and Below)ReferenceDescriptionNoteProcedureNoteAlAl KeyboardAl A

4. Final Display Adjustments (SN 3001A and Below)5. For best overall focusing of the display, adjust the followingpotentiometers in the sequence liste

4. Final Display Adjustments (SN 3004A and Above)4. Final DisplayAdjustments (SN3004A and Above)ReferenceDescriptionEquipmentProcedureNoteAlAl Keyboar

4. Final Display Adjustments (SN 3004A and Above)R120R220R512 R513R319R426 R437Figure 3-32. Location of Final Display Adjustments on AlA‘Ihble 3-6. In

4. Final Display Adjustments (SN 3004A and Above)NoteNote9.10.11.AlA2R517 ASTIGAlA2R513 3DAlA2R409 FOCUS COMPPress (o--2.5), (REFERENCE LEVEL] and t

4. Final Display Adjustments (SN 3004A and Above)17. Adjust AlA2R512 ORTHO and the front-panel ALIGN controlto optimize the orientation and appearance

5. Log Amplifier Adjustments5. Log AmplifierAdjustmentsReferenceRelated PerformanceTestsNoteDescriptionEquipmentIF-Display SectionA4A3 Log Amplifier-F

‘Ihble l-l. Recommended Test Equipment (3 of 6)InstrumentMETERSDigitalVoltmeterDC High VoltageProbePower MeterPower SensorPower SensorDigitalPhotomete

5. Log Amplifier AdjustmentsProcedure1. Position the spectrum analyzer upright as shown in Figure 3-33.Remove the IF-Display section top cover.2. Set

5. Log Amplifier AdjustmentsBandpass Filter6. Press LOG CENTER dB/DIv).Center Adjustment7. Set the frequency synthesizer for 7.6000 MHz at +5.0 dBm ou

5. Log Amplifier Adjustments20. Adjust A4A2R61 ATTEN for DVM indication of + 1.000 fO.OOO1 Vdc. See Figure 3-34 for location of adjustment. If unable

6. Video Processor Adjustments6. Video ProcessorAdjustmentsReferenceIF-Display SectionA4Al Video ProcessorRelated PerformanceTestLog Scale Switching U

6. Video Processor Adjustments6. Set step attenuator to 120 dB. DVM indication should be 0.0000f0.0005 V dc. If DVM indication is out of tolerance, ad

6. Video Processor Adjustments22. Decrease reference level to -70 dBm using the step key.23. DVM indication should be +0.200 f0.002 V dc greater than

7. 3 MHzBandwidth FilterAdjustmentsReferenceIF-Display SectionA4A7 3 MHz Bandwidth FilterRelated PerformanceResolution Bandwidth Switching Uncertainty

EquipmentProcedureFrequency Zero CheckFilter Center andSymmetryAdjustmentsNote7. 3 MHz Bandwidth Filter Adjustments1O:l Divider Probe, 10 MW7.5 pF (2

7. 3 MHz Bandwidth Filter AdjustmentsA4A73 MHz Bandwidth FilterA4A7Figure 3-38.Location of Center, Symmetry, and 10 Hz AmplitudeAdjustments9. Remove c

7. 3 MHz Bandwidth Filter AdjustmentsFilter Peak AdjustNoteThe adjustment ranges of A4A7C13 PK, A4A7C22 PK, A4A7C31PK, and A4A7C40 PK are all indirect

‘Ihble l-l. Recommended Test Equipment (4 of 6)Instrument1 dB StepAttenuator3 dBAttenuator30 dBAttenuatorI’ERMINATIONSkrminationrerminationFermination

7. 3 MHz Bandwidth Filter AdjustmentsA4A73 MHz Bandwidth FilterFigure 3-39. Location of 3 MHz Peak Adjustments26. Move the oscilloscope channel 4 prob

7. 3 MHz Bandwidth Filter Adjustments10 Hz Amplitude37. Connect CAL OUTPUT to RF INPUT. Key in (-1, C-1 9,Adjustments@E--ET) 10 Hz.38. Adjust the spec

8. 21.4 MHzBandwidth FilterAdjustmentsReferenceRelated PerformanceTestsDescriptionIF-Display SectionA4A4 Bandwidth FilterA4A8 Attenuator-Bandwidth Fil

EquipmentProcedure1.+ 10 V TemperatureCompensation SupplyCheckA4A4 LC Adjustments5.8. 21.4 MHz Bandwidth Filter AdjustmentsDigital Voltmeter (DVM) . .

8. 21.4 MHz Bandwidth Filter Adjustments11.12.13.A4A4 XTAL 14.Adjustments15.16.17.18.19.20.21.Key in [RESBW) 100 kHz, C-SPAN) 200 kHz and MARKER(PEAK

8. 21.4 MHz Bandwidth Filter Adjustmentsfor satisfactory signal symmetry, increase or decrease value ofA4A4C66. Refer to ‘Iable 3-3 for range of value

8. 21.4 MHz Bandwidth Filter Adjustments32. Adjust A4A8R35 LC to align markers on display. MARKER A levelshould indicate 1.00 X. See Figure 3-43 for l

8. 21.4 MHz Bandwidth Filter AdjustmentsA10 dB and A20 dB43. Connect CAL OUTPUT to RF INPUT through 1 dB and 10 dB stepAdjustmentsattenuators. Set ste

8. 21.4 MHz Bandwidth Filter Adjustments57.58.59.60.61.62.63.64.65.66.67.68.69.70.71.Adjust A4A4C41 LC DIP for minimum amplitude of signalpeak. See Fi

9. 3 dB Bandwidth Adjustments9. 3 dB BandwidthAdjustmentsReferenceRelated PerformanceTestDescriptionEquipmentProcedure(For instruments with Option 462

‘able l-l. Recommended Test Equipment (5 of 6)InstrumentAC Line-PowerSource(Rx- Option 400)PowerSplitterPlanar-dopedBarrier DiodeDetectorReactive Powe

9. 3 dB Bandwidth AdjustmentsA4A9IF CONTROLA4A9Figure 3-45. Location of 3 dB Bandwidth Adjustments9. On the spectrum analyzer, key in [FREQUENCY SPAN)

20.On the spectrum analyzer, key in the following settings:(CENTER FREQUENCY)...100 MHzFREQUENCY SPAN);&VT)...

9. 3 dB Bandwidth Adjustments31.Adjust A4A9R65 10 kHz for a MARKER A indication of -3.00 dB&0.05 dB.32.On the spectrum analyzer, press QfJ several

9. 3 dB Bandwidth AdjustmentsA4A7R100, A4A7R102, and A4A7R104. If it is necessary to increaseone of these 3-dB bandwidths, increase the value of one o

10. Step Gain and18.4 MHz LocalOscillatorAdjustmentsReferenceRelated PerformanceTestsDescriptionIF-Display SectionA4A7 3 MHz Bandwidth FilterA4A5 Step

10. Step Gain and 18.4 MHz Local Oscillator AdjustmentsEquipmentDigital Voltmeter (DVM)...HP 3456APower Meter...

10. Step Gain and 18.4 MHz Local Oscillator Adjustments14. Note MARKER amplitude in mV and adjust A4A5R33 CAL to70.7 mV (top CRT graticule line). See

10. Step Gain and 18.4 MHz Local Oscillator AdjustmentsA4A5 STEP GAINR32R44 R54SGlOSGZO-1SGZO-2R70 R62A4A5Figure 3-48. Location of 10 dB Gain Step Adj

10. Step Gain and 18.4 MHz Local Oscillator Adjustments0.1 dB Gain Step34.Adjustment35.36.37.18.4 MHz Local38.Oscillator Adjustment 39.40.Key in LIN,

10. Step Gain and 18.4 MHz Local Oscillator AdjustmentsNoteFactory-select component A4A7R60 affects the adjustment ofA4A6AlR29 WIDE GAIN. If the value

‘Ihble l-l. Recommended Test Equipment (6 of 6)Instrument Critical Specifications forRecommendedPerf.Adj,Equipment SubstitutionModelTestADAPTERSAdapte

11. Down/UpConverterAdjustmentsReferenceIF-Display SectionA4A6 Down/Up ConverterRelated PerformanceTestResolution Bandwidth Switching Uncertainty Test

11. Down/Up Converter AdjustmentsNoteThe adjustment of A4A6AlR29 WIDE GAIN is affected byfactory-select component A4A7R60, which sets the overall gai

11. Down/Up Converter Adjustments21.4 MHz Gain18.4 MHz NullAdjustment9.10.11.12.13.14.15.16.17.18.19.20.21.22.~CENTER FREQUENCY) 21.4 MHz, CFREQUENCY

11. Down/Up Converter Adjustments23. Connect the tip of the active probe to A4A4TP7, and adjustA4A6AlC31 18.4 MHz NULL for minimum amplitudes of thedi

12. 10 MHzStandardAdjustment (SN2637A and Below)ReferenceDescriptionEquipmentFrequency StandardProcedureNoteRF-Section:A22 10 MHz Frequency StandardA2

12. 10 MHz Standard Adjustment (SN 2637A and Below)message should typically appear on the spectrum analyzer display for10 minutes or less after line p

12. 10 MHz Standard Adjustment (SN 2637A and Below)Frequency Counter should now display the difference betweenthe frequency of the INPUT A signal (A22

12. 10 MEtz Standard Adjustment (SN 2637A and Below)14. Remove the two adjustment cover screws from the A22 10 MHzFrequency Standard. Refer to Figure

12. 10 MHzStandardAdjustment (SN2728A and Above)ReferenceRF-Section:A22 10 MHz Frequency StandardA22Al Frequency Standard RegulatorA22A2 10 MHz Quartz

12. 10 MHz Standard Adjustment (SN 2728A and Above)Replacement oscillators are factory-adjusted after a complete warmupand after the specified aging r

kernG11223241516 37181926X218 x 218 x 2DescriptionIHP Fart NumberIExtenderBoard:20contacts,2rows of1085680-60028ExtenderBoard:12contacts,2rows of60850

12. 10 MHz Standard Adjustment (SN 2728A and Above)4. Disconnect the short jumper cable on the RF Section rear panelfrom the FREQ REFERENCE INT connec

10.11.12.13.12. 10 MHz Standard Adjustment (SN 2728A and Above)If the difference between reading #2 and reading #l is greaterthan 1 mHz, the A22 10 MH

12. 10 MHZ Standard Adjustment (SN 2728A and Above)L.TOP VIEWFigure 3-55. Location of 10 MHz Standard Adjustments15. On the Frequency Counter, select

13. Sweep, DAC, and Main Coil Driver Adjustments13. Sweep, DAC,and Main CoilDriverAdjustmentsReferenceRelated PerformanceTestsDescriptionNoteEquipment

13. Sweep, DAC, and Main Coil Driver AdjustmentsProcedure1. Position the spectrum analyzer on its right side as shown inFigure 3-56, with bottom cover

13. Sweep, DAC, and Main Coil Driver AdjustmentsPress [j)connect dots . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

13. Sweep, DAC, and Main Coil Driver AdjustmentsAl6A19 SCANDAC GENERATORTOP VIEWA19 (85660-60212)Al6 (85660-60247)Figure 3-58. Location of Sweep and D

13. Sweep, DAC, and Main Coil Driver Adjustmentsh, stopped12.00 V/divoffset: 3.500 v10.00 : I dci w ..-...; ..-... i -..._. . . . . . . ..i ..

13. Sweep, DAC, and Main Coil Driver AdjustmentsOffset and YTO DAC15. Perform this step only if the Al6 Scan Generator is P/NAdjustments85660-60134 or

13. Sweep, DAC, and Main Coil Driver Adjustments17. Perform this step only if the A19 Digital-to-Analog Converteris P/N 85660-60164 or 85660-60038. (H

2Performance TkstsIntroductionVerifkation ofSpecificationsThe procedures in this section test the instrument’s electricalperformance using the Specif

13. Sweep, DAC, and Main Coil Driver AdjustmentsYTO Main Coil Driver19.Adjustments(Preferred Procedure) 20.21.C.d.e.f.8.h.i..i.k.1.m.n.0.P.Key in @Z?X

13. Sweep, DAC, and Main Coil Driver Adjustments22. Key in (2--22), [SHIFT) I-]), SWEEP C-J, m@i%EiF~, CFREQUENCY SPAN) 0 Hz, (CENTER FREQUENCY) 2.3 G

13. Sweep, DAC, and Main Coil Driver Adjustments31.32.33.34.35.36.37.38.39.40.41.SPECTRLU ANALYZERFigure 3-63.YTO Main Coil Driver Adjustments Setup

42.43.44.Adjust A20R25 6.15 GHz to align nearest comb tooth with centerCRT graticule line.Key in (RECALL) 4.Adjust A20R34 2.3 GHz to align nearest com

13. Sweep, DAC, and Main Coil Driver Adjustments59.Band Overlap 60.Adjustments61.62.63.64.65.66.67.68.69.70.71.72.Alternately press [PEAK SEARCH) and

13. Sweep, DAC, and Main Coil Driver Adjustments73. Use signal generator TUNING control to vary signal generatoroutput frequency flO0 MHz (from freque

14. 100 MHz VCXOAdjustmentsReferenceRF-Section:A7A2 100 MHz VCXORelated PerformanceNoise Sidebands TestTestsResidual Responses TestDescriptionThe open

14. 100 MFIz VCXO Adjustmentsshort BNC jumper cable W15 is connected between 52 FREQREFERENCE EXT and 53 FREQ REFERENCE INT.3. Set the dc power supply

14. 100 MHz VCXO AdjustmentsNote\ ICENTER iD8.000 00 MHZSPAN 3.00 kHZRES BW 1 kHZ“BW 3 ktiZSWP 3Em msecFigure 3-66. Typical Tuning Range of A7A2 100 M

14. 100 MHz VCXO AdjustmentsTRACE A . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . CLEAR-WRITETRACE B . . . . . . . . . . .

‘Ihble 2-1. Performance Test Cross-ReferenceFunction or Characteristic Tested Test Performance TestNo.Center Frequency Readout1Center Frequency Readou

14. 100 MHz VCXO Adjustmentsoutput signal. Verify that the 100 MHz harmonics do not exceedthe levels listed in ‘Iable 3-8‘Ihble 3-8. Limits for 100 MH

ResistorFIP Fart Number6.80683-068512.10757-037917.80757-029423.70698-343 131.60757-018038.30698-343546.4 0698-403751.10757-039461.90757-02761100757-0

15. M/N LoopAdjustmentsReferenceRF-Section:A7A4 M/N OutputDescriptionThe M/N VCO tuning range end points and output level are set andchecked to ensure

15. M/N Loop AdjustmentsA7A4AlZTPZ/A12TP3M/NLOCK INDICATOROUTPUTDISABLEAlAlClTPlFREO ADJTUNEIA7A4AlAlC5POWERA2J3AlA2WlFigure 3-68. Location of PLL Adj

15. M/N Loop Adjustments14.Adjust the AMPTD CAL control on the second spectrum analyzerfor a -10.00 dBm displayed signal, and then press (SHIFT)(FREQU

16. YTO Loop Adjustments16. YTO LoopAdjustmentsReferenceRF-Section:Al lA5 SamplerAllA YTO Loop InterconnectRelated PerformanceTestsAverage Noise Level

16. YTO Loop AdjustmentsISPECTRW ANALYZERFigure 3-69. YTO Loop Adjustment SetupAZlTP2AllJlAllJ2AllAlAllJ3WllA12TP2A12TP3AllJ5AllJ4e. .e . -a-,AT2,&apo

16. YTO Loop Adjustmentsmounting hole located on the chassis divider next, to the AlOAlPLLl VCO Assembly.Figure 3-71. All YTO Loop Service Position6.

16. YTO Loop Adjustments13.14.15.16.17.18.19.20.REFERENCE LEVEL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +5 dBmLOG SCALE .

16. YTO Loop AdjustmentsST‘\RT 2Figure 3-72.Typical YTO Loop Swept Frequency Response at AllAl21. On the second spectrum analyzer, key in [PEAK SEARCH

Equipment RequiredEquipment required for the manual performance tests andadjustments is listed in ‘Ikble l-l, Recommended Test Equipment. Anyequipment

16. YTO Loop AdjustmentsFrequency determined in step 25, and set the power meter CALFACTOR control accordingly. Connect the power sensor to theSMA fem

16. YTO Loop Adjustments32. Set the oscilloscope controls as follows:Press (CHAN_):Channel 1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

16. YTO Loop Adjustmentshp runningj . .._...^_.._..._...~...~... ~__ _.._..._...~-

16. YTO Loop Adjustments41.All YTO Loop Frequency:MHzOn the synthesized sweeper, press Icw) and key in the M/N LoopFrequency from step 40.42.43.Press

16. YTO Loop Adjustments48. On the second spectrum analyzer, key in (ENTER dB/DIv) 2 dB,(j-1 3 MHz, MARKER (jNORMALj, (PEAK SEARCH] to position amarke

16. YTO Loop AdjustmentsNoteIf the power level of the displayed fundamental below 20 MHz is toolow, decrease the value of factory-select component All

17. 20/30 LoopPhase LockAdjustmentsReferenceRF-Section:A10 20/30 SynthesizerAlOAl PLLl VCOAlOA3 PLLl IFAlOA4 PLL3 Up ConverterAlOA5 PLL2 VCOA 1 OA8 P

17. 20/30 Loop Phase Lock AdjustmentsEquipmentSpectrum Analyzer...HP 8566BHigh-frequency Active Probe...

17. 20/30 Loop Phase Lock Adjustments3. Set the frequency synthesizer for a 20 kHz, 0 dBm output.Connect the frequency synthesizer 50-ohm OUTPUT to Al

17. 20/30 Loop Phase Lock AdjustmentsAlOAlAlOA3PLLl vcoPLLl IF\ n/TOP VIEWLl3 170MHzNULLL12 160MHzNULLLll 165MHzNULLC26*Al OA3TP3Place ActProbe herL7

1. CenterFrequency ReadoutAccuracy ‘l&tRelated Adjustments10 MHz Standard AdjustmentSweep, DAC, and Main Coil Driver AdjustmentsSpecificationsFor

17. 20/30 Loop Phase Lock Adjustments20. Press CmGHz_ on the second spectrum analyzer. Set the controlsof the second spectrum analyzer as follows:CENT

29.Set the controls of the second spectrum anaiyzer as follows:CENTER FREQUENCY . . . . . . . . . . . . . . . . . . . . . . . . . 165 MHzFREQUENCY SPA

17. 20/30 Loop Phase Lock Adjustments42.43.44.45.On the second spectrum analyzer, press (CENTER FREQUENCY) 140MHz MARKER (PEAK SEARCH] to position a m

17. 20/30 Loop Phase Lock AdjustmentsPhase Lock Loop 2wJ4NoteIf PLL2 is phaselocked, proceed to step 12. If PLL2 will not phaselock(PL2 UNLOCK indicat

17. 20/30 Loop Phase Lock AdjustmentsAlOA8 PLLZAlOA5 PLL2 VCODISCRIMINATOR\R2150MHzR4 1OOMHzITOP VIEWAlOA8AlOA5Figure 3-79. Location of PLL2 Adjustmen

11.12.13.14.15.16.17.17. 20/30 Loop Phase Lock AdjustmentsSet the RF Section LINE switch to STANDBY. Disconnect thefrequency counter from AlOA5J4 SCAN

17. 20/30 Loop Phase Lock AdjustmentsPhase Lock Loop 31. Set the RF Section LINE switch to STANDBY. Remove AlOA4(P=92.3.4.PLL3 Up Converter Assembly f

17. 20130 Loop Phase Lock AdjustmentsNote.Adjustments AlOA4L16 160 MHz PEAK and AlOA4L17 160 MHzPEAK are sealed at the factory and normally do not re

17. 20/30 Loop Phase Lock Adjustments12. Set the controls of the second spectrum analyzer as follows:CENTER FREQUENCY...

17. 20/30 Loop Phase Lock Adjustments19. Set the RF Section LINE switch to STANDBY. Disconnect the DVMfrom AlOA4TP3 and the second spectrum analyzer f

Notice.The information contained in this document is subject to changewithout notice.Hewlett-Packard makes no warranty of any kind with regard to this

DescriptionEquipmentProcedure1. Center Frequency Readout Accuracy TestA synthesized signal source that is phase-locked to a known frequencystandard is

18. RF ModulePhase LockAdjustmentsReferenceRF-Section:A6A9 Phase LockDescriptionThe 3.3 GHz Heterodyne Phase Lock Loop sampler circuits and 300MHz Tri

18. RF Module Phase Lock AdjustmentsSPECTRUU ANALYZERDIGITIZINGSPECTRM ANALYZERFigure 3-81. RF Module Phase Lock Adjustments SetupA6A5%&3kI ESA6A9

18. RF Module Phase Lock Adjustments6. Connect the DVM to A6A9AlE5, and connect the DVM ground tothe metal case/shield of the A6A9 Phase Lock Assembly

12.100 MHz Tripler13.Adjustments14.15.16.17.18.19.20.18. RF’ Module Phase Lock AdjustmentsDisconnect cable 85 (gray/green) from A6A9J3 100 MHz INPUT,c

18. RF Module Phase Lock AdjustmentsSampler Output2 1. Use a BNC to SMB snap-on test cable to connect the oscilloscopeBalance AdjustmentChannel 1 inpu

18. RF’ Module Phase Lock Adjustments25. Adjust A6A9AlR38 BALANCE for a dead time betweenconsecutive voltage ramps of 3.5 f 0.1 msec. Each voltage ra

19. CAL OutputAdjustmentReferenceDescriptionEquipmentProcedure, RF-Section:A6A9 Phase LockRelated Performance Test:Calibrator Amplitude Accuracy TestA

19. CAL Output AdjustmentA6ASSEMBL I ESA6A9AlRllCOVER CAL ADJc29RllTRIPLER MATCH CAL OUTPUTRlOA6A9AlFigure 3-85. Location of CAL OUTPUT AdjustmentNote

19. CAL Output AdjustmentCENTER 550 MHZSPAN 1 an GHZRES BW 3 MHZ“BW 3 MHZSWP 25.a msecFigure 3-86. CAL OUTPUT Harmonics10. On the second spectrum anal

20. Last Converter Adjustments20. Last ConverterAdjustmentsReferenceDescriptionEquipmentProcedureRF-Section:A6A3 Last ConverterA 321.4 MHz signal from

1. Center Frequency Readout Accuracy TestFigure 2-2. Center Frequency Accuracy MeasurementNoteThe spectrum analyzer CENTER FREQUENCY readout may fallo

20. Last Converter AdjustmentsSPECTRW ANALYZERFigure 3-87. Last Converter Adjustments Setup4. Remove the RF Section right side cover (now on the left)

20. Last Converter AdjustmentsNoteA6A3AlC2310.7 MHz NOTCHFILTER ADJUSTI LA6A3ilC12 A6A3A.lClOA6A3ilC8RIGHTASSE&L I ESA6A3SIDELASTCOVERCOVER CONVER

20. Last Converter Adjustments15. Move the probe to the access hole above A6A3AlC8 (therightmost access hole). Adjust A6A3AlC9 (second access holefro

20. Last Converter AdjustmentsGenerator Assembly, and the A6A12 YTX Driver Assembly in theRF Section. Replace the cover on the A6 RF Module.29. Reconn

2 1. FrequencyResponseAdjustmentsReferenceRelated PerformanceTestDescriptionRF Section:A6A3 Last ConverterA6AlO Miscellaneous Bias/Relay DriverA6All S

2 1. Frequency Response Adjustmentsinput mixer. In Band F (the external mixing bands), the output of anexternal harmonic mixer is connected to the fro

2 1. Frequency Response AdjustmentsNoteProcedurePreliminaryAdjustmentsAdapters:Type N (f) to BNC (m) . . . . .Type N (f) to APC 3.5 (f) . .APC 3.5 (f)

2 1. Frequency Response AdjustmentsA12TP2,TP3LOCK INDICATORDISABLE/R84 GAINR48AlR51R2R69R54R7282ClC2DlR75R60A6All\R78 E2Rl IORQ VER12 VDR15 VCR18 VBR2

2 1. Frequency Response Adjustmentsverify that the power meter indication is -10.00 dBm fO.10dB. If the 100 MHz CAL OUTPUT power level is not within t

2 1. Frequency Response AdjustmentsNotef9 Vdc Reference Supplies adjustment A6A12R113 -9 V affectsYTX/YTO tracking, YTX diode bias, and Slope Generato

1. Center Frequency Readout Accuracy Test‘lhble 2-2. Center Frequency Readout AccuracyIsynthesized (FREQUENCY SPAN] I [CENTER FREQUENCY]SweeperFrequen

2 1. Frequency Response Adjustments22. On the synthesized sweeper, press CPOWER LEVEL] and adjustthe ENTRY knob as necessary for a power meter indicat

2 1. Frequency Response Adjustments32. On the spectrum analyzer, key in 1-1, (SHIFT] TRACE A@iXKKK] b. Set the spectrum analyzer controls as follows:S

2 1. Frequency Response Adjustmentsclockwise to increase the level of the displayed signal responsesabove 500 MHz.NoteIt might be helpful to increase

2 1. Frequency Response Adjustmentsset to internal leveling, which introduces minor leveling errors butpermits much faster sweep times.40. Repeat step

2 1. Frequency Response AdjustmentsBand B, 2.0 GHz to 5.846. On the spectrum analyzer, key in @?iTEiC), CFREQUENCY SPAN) 0GHzHz, (CENTER FREQUENCY) 4

2 1. Frequency Response Adjustmentssweeper front panel LEVELING EXT INPUT using a BNC to SMBsnap-on test cable.POmR SENSORFigure 3-94.Frequency Respon

21. Frequency Response Adjustmentssignal on the spectrum analyzer display. See Figure 3-90 for thelocations of A6A12R63 5.8 GHz and A6AlOR18 VB.NoteIf

2 1. Frequency Response Adjustments70. Set the synthesized sweeper controls as follows:START FREQ . . . . . . . . . . . . . . . . . . . . . . . . . .

2 1. Frequency Response Adjustments73. On the spectrum analyzer, key in [SWEEP TIME) 5s, LOG SCALE[ENTER dB/Divj 1 dB, TRACE B IVIEW), m 4, C-1 2s,TRA

81.82.83.84.85.86.87.88.2 1. Frequency Response AdjustmentsOn the spectrum analyzer, key in [=I 4, m IGHz) / anduse the DATA knob to gradually change

2. Frequency SpanAccuracy ‘I&tRelated AdjustmentSweep, DAC, and Main Coil Driver AdjustmentsSpecificationFor spans In X 5 MHz, fl% of indicated fr

2 1. Frequency Response Adjustmentsacceptable range of values for A6AlOR87, and Table 3-4 for HP partnumbers. See Figure 3-90 for the location of A6Al

2 1. Frequency Response Adjustmentspeaks of these responses coarsely outline the spectrum analyzerfrequency response.I II IIII II IIIII I IIIII I I II

2 1. Frequency Response Adjustments101.102.103.104.Readjust 22-turn (IF Offset) potentiometer A6A12R84 C asnecessary to maximize the overall level of

2 1. Frequency Response AdjustmentsSTART5PiIIIII5.80 GHZSTOP 1250GHZRES ew3M”Z“BW 3 MHZ SWP 150setFigure 3-98..cal Frequency Response (5.8 GFh - 12.5

2 1. Frequency Response Adjustments3.40 dB. See the TRACE B reference waveform to indicate whichportions of the frequency response waveform require re

119.On the spectrum analyzer, key in LOG SCALE (ENTER dB/Div) 2dB, MARKER L@Z%Zj.120.Readjust 22-turn (IF Offset) potentiometer A6A12R83 D asnecessary

2 1. Frequency Response Adjustments126.127.128.129.the high end of the band drop in amplitude by approximately0.75 dB.Readjust 22-turn (IF Offset) pot

130.131.132.133.134.135.136.137.138.139.21. Frequency Response AdjustmentsOn the spectrum analyzer, key in (j-1 4, (HOLD) and repeatsteps 126 through

2 1. Frequency Response AdjustmentsNoteIf A6AlO Miscellaneous Bias/Relay Driver Assembly is HP P/N85660-60322 (HP 85660AB RF Sections with serial num

2 1. Frequency Response AdjustmentsNoteSWEEP TIME...30 msSWEEP...

2. Frequency Span Accuracy TestEquipmentFrequency Synthesizer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . HP 3335ASynthesi

2 1. Frequency Response Adjustments153.154.155.156.157.158.159.160.161.162.163.marker. See Figure 3-90 for the locations of A6AlOR70 LB4and A6AlOR76 L

21. Frequency Response Adjustments4.40 dB from 18.6 GHz to 20.0 GHz, and 6.00 dB from 20.0 GHzto 22.0 GHz. See the TRACE B reference waveform to indic

2 1. Frequency Response AdjustmentsSTOP FREQ . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18.6 GHzRES BW . . . . . . . . . . .

2 1. Frequency Response Adjustments177.If the Preselector DAC value difference recorded in step 176is greater than f0.5, remove the A6A12 YTX Driver A

2 1. Frequency Response AdjustmentsLOG SCALE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 dB/DIV187. Press MARK

22.Analog-To-DigitalConverterAdjustmentsReferenceA3A8 Analog-to-Digital ConverterDescriptionThe Analog-to-Digital Ramp Converter is adjusted at zero a

22. Analog-To-Digital Converter Adjustmentsd. Connect the oscilloscope channel 1, 10: 1 probe to A3A8TPlland ground the probe ground to the A3 section

22. Analog-To-Digital ConverterAdjustmentsA3A8ANALOG-TO-DIGITAL CONVERTER(Beneath Cover)Alternate Procedure 4.Procedure without using Low-Noise DC Sup

23. Track and Hold Adjustments23. Track and HoldAdjustmentsReferenceA3A9 Track and HoldDescriptionThe CAL OUTPUT signal is connected to the RF INPUT.

2. Frequency Span Accuracy TestSPECTRUM ANALYZERSYNTHESIZED SWEEPERADAPTERPADFigure 2-4. Wide Span Test Setup10. Press ~NSTR PRESET) on HP 8340A Synth

23. Track and Hold AdjustmentsA3A9TRACK AND HOLD(Beneath Cover)A3A9Figure 3-103. Location of Track and Hold Adjustments10. Key in [m) TRACE A (jj) b.1

23. Track and Hold Adjustments25. Repeat steps 4 through 24 until no further adjustments arerequired.Adjustments 3-211

24. Digital StorageDisplayAdjustmentsReferenceDescriptionEquipmentProcedureA3A 1 TriggerA3A2 Intensity ControlA3A3 Line GeneratorFirst, preliminary CR

24. Digital Storage Display AdjustmentsPreliminary Graticule3. Press TRACE A @KiiKJAdjustments4. Adjust A3A3R4 X GAIN and A3A3R5 Y GAIN to place grati

24. Digital Storage Display Adjustments11.12.Sample and Hold13.Balance Adjustments 14.15.16.17.18.Adjust A3A3R8 YSL so that the vertical graticule lin

24. Digital Storage Display Adjustmentsi ..__...~~~... -.- _.._.._.__._...__. - ._._..._._ i ..~...-” .._...” .._...,,.,..,.

24. Digital Storage Display AdjustmentsX and Y Offset and24.Gain Adjustments 25.26.27.28.29.30.31.32.33.34.35.36.37.38.39.40.Press (2-22].Key in (FREQ

24. Digital Storage Display AdjustmentsFinal Graticule41. Press @??ZiZJ, TRACE A ~~~.Adjustments42. Set A3A2R12 LL THRESH fully clockwise.43. Adjust A

Low-Noise DCSUPPlYThe Low-Noise DC Supply shown in Figure 3-108 can be constructedusing the parts listed in ‘Ihble 3-17.Figure 3-108. Low-Noise DC Sup

Crystal Filter Bypass Network ConfigurationCm&al FilterThe Crystal Filter Bypass Network Configuration shown inBypass NetworkConfigurationFigure 3

2. Frequency Span Accuracy Test‘able 2-4. Wide Span AccuracySpectrum Analyzer Synthesized SweeperMARKER A FrequencyCENTER FREQUENCY I [FREQUENCYSPAN)

4Option 462IntroductionThis chapter contains modified performance tests and adjustmentprocedures for Option 462 instruments. When working on Option462

3. 6 dB ResolutionBandwidthAccuracy ‘I&tRelated AdjustmentSpecificationDescriptionEquipmentProcedure6 dB Bandwidth Adjustmentsf20%, 3 MHz bandwidt

3. 6 dB Resolution Bandwidth Accuracy TestMKR a 3.103 MHZhPhP REF -9.0 dBmREF -9.0 dBmATTENATTEN 10 dB10dB0.00 dE0.00 dELINEARLINEARCENTER 100.00 MHzC

3. Impulse andResolutionBandwidthAccuracy T&tRelated AdjustmentSpecificationDescriptionSYNTHES I ZEALEVEL GENERATORImpulse Bandwidth Adjustmentsf2

3. Impulse and Resolution Bandwidth Accuracy TestProcedure1. Set the frequency synthesizer for a 15 MHz, + 13 dBm output.Connect the output of the fre

3. Impulse and Resolution Bandwidth Accuracy Test13.14.15.16.17.18.19.20.21.22.23.24.25.26.27.28.Press MARKER [PEAK SEARCH). Record the MARKER amplitu

3. Impulse and Resolution Bandwidth Accuracy Test29. Set the frequency synthesizer (FREQUENCYI to 1 kHz. On thespectrum analyzer key in: @0.5 seconds,

3. Impulse and Resolution Bandwidth Accuracy TestdB). ‘lb center the trace on screen, it may be necessary to pressSWEEP (ZGY) and adjust (CENTER FREQU

3. Impulse and Resolution Bandwidth Accuracy Test‘Ihble 4-2. Impulse Bandwidth AccuracyMarker Readouts for:1 Calculated Impulse Bandwidth-43 MHz (i)1

4. 6 dB ResolutionBandwidthSelectivity TkstRelated AdjustmentsSpecificationDescriptionEquipmentNoteProcedure3 MHz Bandwidth Filter Adjustments21.4 MHz

3. ResolutionBandwidthAccuracy ‘IkstRelated AdjustmentSpecificationDescriptionEquipmentProcedure(For instruments with Option 462, refer to Chapter 4.)

4. 6 dB Resolution Bandwidth Selectivity Test7. Vary spectrum analyzer settings according to Table 4-4. PressSWEEP (SINGLE) and measure the 60 dB band

4.6 dB ResolutionBandwidth Selectivity Testable 4-4. 6 dB Resolution BandwidthSelectivitySpectrum AnalyzerMeasured Measured BandwidthMaximumjZGiiF) [F

4. Impulse and Resolution Bandwidth Selectivity Test4. Impulse andResolutionBandwidthSelectivity !kstRelated AdjustmentSpecificationDescriptionNoteEqu

4. Impulse and Resolution Bandwidth Selectivity Test4.5.6.7.8.9.MKR A 14.04 MHzf?PREF0.0 dBrnATTEN 10 dB-0.30 dB10 dB/CENTERSPAN 20.0 MHzIII100.0 MHZR

4. Impulse and Resolution Bandwidth Selectivity Test‘Ihble 4-5. Impulse and Resolution Bandwidth SelectivityrSpectrum AnalyzerTResBW3 MHz (i)1 MHz (i)

5. Impulse andResolutionBandwidthSwitchingUncertainty TkstRelated AdjustmentSpecificationDescriptionEquipmentProcedure3 MHz Bandwidth Filter Adjustmen

5. Impulse and Resolution Bandwidth Switching Uncertainty TestMKR ~3 0 Hzh!REF -8.0 dEmATTEN 10 dB0.00 dBII I III IIII ICENTERI InI I100.00 MHzRES q W

Tkst 3. 6 dBResolutionBandwidthAccuracy ‘J&t (p/oSble 2-24,Performance TkstRecord)3 MHz1 MHz300 kHz100 kHz30 kHz10 kHz3 kHz1 kHz300 Hz100 Hz30 Hz1

Test 3. Impulse and Resolution Bandwidth Accuracy Test (p/o ‘Ihble 2-24, Performance Test Record)T&t 3. Impulseand ResolutionBandwidthAccuracy Wst

Test 3. Impulse and Resolution Bandwidth Accuracy Test (p/o ‘able 2-24, Performance Test Record)Steps 39 through 46. 6 dB Resolution BandwidthAccuracy

3. Resolution Bandwidth Accuracy TestiFigure 2-5. Resolution Bandwidth Measurement8. Vary spectrum analyzer settings according to ‘Ihble 2-5. PressSWE

Test 4. 6 dB Resolution Bandwidth Selectivity (p/o ‘Ihble 2-24, Performance Test Record)3 MHz1 MHz300 kHz100 kHz30 kHz10 kHz3 kHz1 kHz300 Hz100 Hz30 H

Tkst 4. Impulseand ResolutionBandwidthSelectivity (p/oable 2-24,Performance T&tRecord)Steps 5 through 9. Impulse and Resolution BandwidthSelectivi

Test 5. Impulse and Resolution Bandwidth Switching Uncertainty (p/o ‘Ihble 2-24, Performace Test Record)Tkst 5. Impulseand ResolutionBandwidthSwitchin

9. 6 dB ResolutionBandwidthAdjustmentsReferenceRelated PerformanceTestDescriptionEquipmentProcedureIF-Display SectionA4A9 IF Control6 dB Resolution Ba

9. 6 dB Resolution Bandwidth Adjustments13. Using the DATA knob, adjust the marker down one side of thedisplay signal to the 6 dB point; CRT MKR A ann

9. 6 dB Resolution Bandwidth Adjustments24. Press MARKER IOFF), then MARKER [nl.25. Using the DATA knob, adjust the marker down one side of thedisplay

9. Impulse Bandwidth Adjustments9. ImpulseBandwidthAdjustmentsReferenceRelated PerformanceTestDescriptionEquipmentProcedureIF-Display SectionA4A9 IF C

9. Impulse Bandwidth Adjustments13. Using the DATA knob, adjust the marker down one side ofthe display signal to the 7.3 dB point; CRT MKR A annotatio

9. Impulse Bandwidth Adjustments[REFERENCE LEVEL_) and using the DATA knob to place the signalpeak near the top of the graticule.24. Press MARKER IOFF

5Option 857IntroductionThis chapter contains the modified amplitude fidelity performancetest for Option 857 instruments. This chapter also contains th

4. ResolutionBandwidthSelectivity YLkstRelated AdjustmentsSpecificationDescriptionEquipmentNoteProcedure(For instruments with Option 462, refer to Cha

8. Option 857Amplitude FidelityPerformance TkstRelated AdjustmentLog Amplifier AdjustmentsSpecification Log:Incrementalf0.1 dB/dB over 0 to 80 dB disp

8. Option 857 Amplitude Fidelity Performance TestEquipmentFrequency Synthesizer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . HP 3335A

8. Option 857 Amplitude Fidelity Performance Test14. Key in the following analyzer settings:FREQUENCY SPAN) . . . . . . . . . . . . . . . . . . . . .

8. Option 857 Amplitude Fidelity Performance Test‘lhble 5-2.Log Amplitude Fidelity (10 kHz RRW; Option 857)Frequency12Fidelity ErrorSynthesizerCalibra

Performance TkstRecordHewlett-Packard CompanyModel HP 8566BSerial No.IF-Display SectionRF SectionTested byReport No.Date5-6 Option 857

Test 8. Option 857 Amplitude FidelityYkst 8. Option 857Amplitude FidelityStep9. Log Amplitude Fidelity (10 Hz RRW)Frequency12Fidelity ErrorCumulativeC

Test 8. Option 857 Amplitude FidelityStep 26. Linear Amplitude FidelityFrequency MARKER ASynthesizer AmplitudeAmplitudeWIWm)0-10Allowable Range(f3% of

6Major Assembly and Component LocationsIF-Display SectionFigure IndexAssemblySee FigureAlAl. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

W23...6-7W24...6-7W25...

A23W5A24A23C4 A23C3FANA23Ul (+5V) A23Q4 W15(+2OV) A2303A23Q2A23QlA23C2/ (-4OV)A23’ MOTHERBOARD- A23W60\.--...--.-------\A6A13RF MODULEMOTHERBOARDA23W

CertificationHewlett-Packard Company certifies that this product met itspublished specifications at the time of shipment from the factory.Hewlett-Pack

4. Resolution Bandwidth Selectivity Test7. Vary spectrum analyzer settings according to Table 2-6. PressSWEEP [SINGLE) and measure the 60 dB bandwidth

Figure 6-2. RF Section, Front ViewA5SWlSTANDBY/ONA6J5A6J4A6J2A6Jlld:“T O&T ::fPb? CAL OUTPUTA5A2RPGA23W7 A23W5A6RlAMPTD CALA6J3RF INPUTA5A 1KEYBOA

A23C 1(-IOV)A22Al7A23C2 A23C3 A23C4(-40V)(+20V) (+5V)A24TH;F?yGH Fd~Q#%CYSTANDARDM/N-REFEREN:;TRANSFORM;;RF MOD”?:Al 1/YToAl242\A1020 30r:SY THESIZERb

Al AlOC2AlAlOC3AlAw7w21AlAAIAI 1W6w21AlAAIVIAlAAIAIOCIAlAlOC4AlA AlA AlAAlAFL1AITI.A4A 1A3A9A3A8A3A7A3A6A3A5A3A4A3A3A3A2‘A3AlII8IFigure 6-4. IF Sectio

AIAIOCIAlAlOC4AlAlOC2AlAlOC3AlAAIVIAlAAlAAlAAlAFL1AITILL00000000000000Figure 6-5. IF Section, ‘Ibp View (SN 3004A and Above),A4A9,A4A8,A4A7,A4A6,A4A5,

AIVIWiAlAl ti2W8Figure 6-6. IF Section, Front View6-8 Major Assembly and Component locations

A4AlOW8W8A3AlOAIAIOLIII\Jwi4W23W25Wi6W27Figure 6-7. IF Section, Bottom View/w29, W24‘W23‘W32(SN 3004Aand above)\AIVIMajor Assembly and Component locat

4. Resolution Bandwidth Selectivity Test‘Ihble 2-6. Resolution Bandwidth SelectivitySpectrum AnalyzerL-1 (FREQUENCY SPAN] (VIDEOJ3 MHz1 MHz300 kHz100

5. Resolution Bandwidth Switching Uncertainty Test5. ResolutionBandwidthSwitchingUncertainty TLkstRelated AdjustmentsSpecificationDescriptionEquipment

5. Resolution Bandwidth Switching Uncertainty TestFigure 2-7. Bandwidth Switching Uncertainty Measurementable 2-7. Bandwidth Switching UncertaintyRES)

6. Log Scale Switching Uncertainty Test6. Log ScaleSwitchingUncertainty TkstRelated AdjustmentSpecificationDescriptionEquipmentProcedureVideo Processo

6. Log Scale Switching Uncertainty TestMKR 100.001 0 Mr.rp REF -8.8d0mATTEN10aB-9.02 ah2 aw/II \,,ICENTER 100.000MHzSPAN 100 Is!42RES DW30 kHtVW100 kt

7. IF Gain Uncertainty Test7. IF GainUncertainty TkstRelated AdjustmentsStep Gain and 18.4 MHz Local Oscillator Adjustments21.4 MHz Bandwidth Filter A

7. IF Gain Uncertainty TestEquipmentProcedure10 dB Gain StepsNoteFrequency Synthesizer... . .HP 3335AAdapter, Type N (m

7. IF Gain Uncertainty TestI’ 1IIII III ycENTE* 22.021 04 LHIPm 2.22 L”,PIES mu I Ill41PIES mu I Ill41van 100 Yevan 100 Yese soa -..ese soa -..eFigure

7. IF Gain Uncertainty Test2 dB Gain Steps13. Press [2], ~jG?iTLT) (FJ.14. Set [REFERENCE LEVEL] to -1.9 dBm.15. Press MARKER (OFFS. Set (jVloEoj to 1

AssistanceProduct maintenance agreements and other customer omistanceagreemxmts are available for Hewlett-Rzckard products.Fbr any assistance, contact

7. IF Gain Uncertainty Test‘lhble 2-11. IF Gain Uncertainty, 0.1 dR Steps(REFERENCE LEVEL’WW0.0-0.1-0.2-0.3-0.4-0.5-0.6-0.7-0.8-0.9-1.0-1.1-1.2-1.3-1.

7. IF Gain Uncertainty Test23. Find the largest positive deviation and the largest negativedeviation for reference level settings from 0 dBm to -70 dB

8. Amplitude Fidelity Test8. AmplitudeFidelity Test(For instruments with Option 857, refer to Chapter 5.)Related AdjustmentLog Amplifier AdjustmentsSp

8. Amplitude Fidelity TestEquipmentFrequency Synthesizer ...HP 3335AAdapter, Type N (m) to BNC (f)...

8. Amplitude Fidelity Test‘Ihble 2-12. Log Scale FidelityFrequency12Fidelity ErrorSynthesizer Calibrated MARKER A Amplitude (Column 2 - Column 1)Ampli

8. Amplitude Fidelity TestLinear Fidelity10. Key in analyzer settings as follows:(VIDEOj...,300 HzFREQUEN

9. Calibrator Amplitude Accuracy Test9. CalibratorAmplitudeAccuracy TestRelated AdjustmentCAL OUTPUT AdjustmentSpecification-10 dBm f0.3 dB; 100 MHzDe

10. FrequencyResponse ‘IkstRelated AdjustmentsSpecificationsDescriptionFrequency Response Adjustments(Includes input attenuator flatness in the 10 dB

10. Frequency Response TestFUNCTIONSPECTRUM ANALYZERGENERATORRFINPUT4ADAPTEROUTPUT V,p.p/Figure 2-14. Frequency Response Test Setup (100 Hz to 100 Id&

10. Frequency Response TestProcedure100Hzto 1OOkHz1. Connect CAL OUTPUT to the RF INPUT on the spectrum analyzer.2. Press C-J, (RECALL) @, MARKER (PEA

General SafetyConsiderationsWarningBefore this instrument is switched on, make sure it has beenproperly grounded through the protective conductor of t

10. Frequency Response TestFigure 2-15.Frequency Response Measurement (1 kHz to 100 kHz)12. The closely spaced series of signal peaks on the display d

10. Frequency Response Test18. Set [CF STEP SIZE) to 100 Hz. Step analyzer (CENTER FREQUENCY)from 100 Hz to 1 kHz with 0J and set function generatorFR

10. Frequency Response Test26. Press START SINGLE 50 SEC SWEEP on the frequencysynthesizer. Wait for completion of the sweep.27. Activate MARKER [NORM

10. Frequency Response Test4MHzto60MHz28. Press t-1 on the spectrum analyzer. Set the spectrumanalyzer controls as follows:[CENTER FREQUENCY] ...

10. Frequency Response Test\’ QADAPTERPDWER UETERBSENSORFigure 2-19.Frequency Response Test Setup (60 MHz to 2.5 GHz, 2 to 22 GEIz)60 MHz to 2.5 GHz36

10. Frequency Response TestNotelb provide the spectrum analyzer with a 60 MHz to 22 GHz inputsignal of sufficient flatness for measuring frequency res

10. Frequency Response Test48.49.50.2 to 22 GHz51.(Preselected Range)52.l~~a,“‘i -7.0, dBm , ATTiN ‘0 ,dS,0.a5 dBIIII IPOS PKSTART 60 MHzSTOP 2.50 GHz

10. Frequency Response Test53. On the synthesized sweeper, key in Icw) 3.0 GHz, CSTART FREQ) 2.0GHz, @7?FEZT) 3.9 GHz, [SWEEP TIME) 150 s, SWEEP [ml,S

10. Frequency Response Test67. On the synthesized sweeper, press [cwl and use the ENTRY knobto position the peak of the displayed TRACE A signal at th

10. Frequency Response TestLEVELING . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . INT78. On the synthesi

How to Use ThisManualThis manual uses theFront-Panel Ker) This represents a key physically located on thefollowinginstrument.conventions:Screen TextTh

10. Frequency Response Test‘Ihble 2-15. Frequency Response (Flatness)12346Frequent y Spectrum AnalyzerCdTrace LimitsRandandFrequent yFlatnessSynthesiz

11. Sweep Time Accuracy TestProcedure1. Connect equipment as shown in Figure 2-21.2. Press [mj SWEEP C-1 on the analyzer.3. Key in the following setti

11. Sweep Time Accuracy Test‘Ihble 2-16.Sweep Time Accuracy, Sweep Times 120 msLSWEEP TIME]Sweep TimeMinMeasuredMax20ms 18 ms22 ms30ms27 ms33 ms50ms45

12. Noise Sidebands Test12. NoiseSidebands ‘lkstRelated AdjustmentsSpecificationDescription100 MHz Voltage-Controlled Crystal Oscillator AdjustmentsSw

12. Noise Sidebands TestSPECTRUM ANALYZER(SOURCE)ADAPTERADAPTERLCAUE AssElluvFigure 2-22. Noise Sidebands Test SetupEquipmentSpectrum Analyzer (1ST LO

12. Noise Sidebands Test5.Key in the following on the analyzer under test:(CENTER FREQUENCY]... 5.7 GHZ[FREQUENCY S

12. Noise Sidebands Test11. A correction factor of 2.5 dB must be added to the value12.13.14.15.16.17.18.19.20.21.22.23.24.25.26.measured in step 9 to

13. Line-Related Sidebands Test13. Line-RelatedSidebands TestSpecificationIOffset from Carrier Center Frequency SidebandsI II<360HZ100Hz to 100 MHz

13. Line-Related Sidebands TestEquipmentSpectrum Analyzer (1ST LO OUTPUT) . . . . . . . . . . . . . . . . HP 8566A/BAC Power Source (Option 400 ONLY)

Contents1. General InformationIntroduction...Instruments Covered by this Manual...Operation Verification...Option

13. Line-Related Sidebands Test9.10.11.12.13.14.15.Figure 2-25. Line-Related Sidebands MeasurementThe MARKER A amplitude for all line-related sideband

13. Line-Related Sidebands Test16. Press CsHlFTl (SWEEP TIMEJ*, SWEEP (CONT), TRACE Af--).17. Change (CENTER FREQUENCY) of both the source and test an

13. Line-Related Sidebands Test12. Press MARKER [PEAK SEARCH), [al and position the marker at thepeaks of the line-related sidebands separated from th

14. Average NoiseLevel TestRelated AdjustmentSpecificationDescriptionEquipmentProcedureLast Converter AdjustmentsDisplayed average noise level (0 dB i

14. Average Noise Level Test8.9.10.11.Figure 2-26. Average Noise Level MeasurementRead the noise level from the MARKER amplitude readout.value should

14. Average Noise Level Testlttble 2-18. Average Noise Level(CENTER FREQUENCY]2.0 MHz1.001 GHz2.499 GHz2.510 GHz5.799 GHz5.810 GHz12.499 GHz12.510 GHz

15. Residual Responses Test15. ResidualResponses ‘IkstSpecificationDescriptionEquipmentProcedurec-100 dBm, 100 Hz to 5.8 GHzc-95 dBm, 5.8 GHz to 12.5

15. Residual Responses TestFigure 2-27. Residual Responses Measurement8. Look for any residual responses at or above the display line. If aresidual is

15. Residual Responses Test11. Follow the procedure of steps 7 through 9 to determine if thereare any residuals >-lo0 dBm in this frequency range.L

15. Residual Responses Test20. Set the display line at -85 dBm.21. Check for residual responses x-85 dBm by using steps 7 through9.Largest Residual Le

Test 11. Sweep Time Accuracy...2-103Test 12. Noise Sidebands Test...2-104Test 13. Line-Related Sidebands...2-105Test 14. Aver

16. Harmonic and Intermodulation Distortion Test16. Harmonic andIntermodulationDistortion TestSpecificationSecond Harmonic DistortionCenter Frequency

16. Harmonic and Intermodulation Distortion TestSPECTRUM ANALYZERSYNTHESIZE0 WEEPERADAPTERLPF (PI0 WHZl------LPF 11200 MHZ)----_Figure 2-28. Harmonic

Harmonic Distortion 1.2.3.4.5.6.7.8.9.10.11.12.16. Harmonic and Intermodulation Distortion TestSet the synthesized sweeper for an output CW frequency

16. Harmonic and Intermodulation Distortion Test18.Press @ZZi%J on the analyzer. Key in the following:&ENTER FREQUENCY_)...

SPECTRUM ANALYZER16. Harmonic and Intermodulation Distortion Test30. Set the other synthesized source RF OUTPUT switch to ON andadjust the output powe

16. Harmonic and Intermodulation Distortion Test36. Wait for completion of the sweep, then press MARKER(PEAK SEARCH].Record the MKR A amplitude:dB.37.

16. Harmonic and Intermodulation Distortion Test. - - ---------r2f1-1,‘If 2212-f,FREQUENCYFigure 2-30. Third Order Intermodulation Products41. Set one

16. Harmonic and Intermodulation Distortion Test49. Press MARKER @. Activate [CENTER FREQUENCY) and press (JJonce to tune to the third order product a

17. Image, Multiple, and Out of Rand Responses Test17. Image,Multiple, and Outof Band ResponsesTkstDescriptionImage and out-of-band responses are chec

17. Image, Multiple, and Out of Rand Responses TestProcedure1. Connect equipment as shown in Figure 2-31 with the synthesizedsweeper RF OUTPUT connect