Agilent Technologies N5416A Instrukcja Użytkownika Strona 21
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- Spis treści
- BOOKMARKI
- Testing 1
- USB2.0 Basics – General 3
- USB2.0 Basics - Architecture 4
- Low Speed Full Speed Hi-Speed 5
- Sig Level 3.3V 3.3V 400mV 5
- Host test requirements 6
- The FS/LS Logo 7
- • USB 2.0 debug suite 8
- Agilent USB 2.0 Solution 10
- Compliance Test Software 10
- USB Transmitter testing 11
- Receiver Testing 13
- N5990A USB test solution 14
- N2774A Current Probe 15
- Outline 16
- Design Challenges 17
- USB Impedance Spec Explained 18
- USB Impedance Measurement 19
- Proper Decoupling 20
- Lowest pad 21
- •Limit inrush events 22
- Rise and Fall time 23
- Slew rate RT/FT methodology 24
- Test Modes 25
- Compliance Pitfalls 27
- Compliance 29
- Waivers 32
- Infiniium 9000 Scope 37
- E2649A USB test fixture 38
- Diff probe 38
- LA on IDE 38
- Data read latency 39
- The serial search and 42
- Summary 43
- Additional Information 44
- Miscellaneous topics 45
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