Agilent Technologies N5416A Instrukcja Użytkownika

Jim Choate Agilent Technologies USB 2.0 Compliance Testing How to design, test and debug your products for success. Members USB-IF

Agilent USB 2.0 Solution • Test all aspects of your USB product using Agilent USB test solutions • At its heart: N5416A USB 2.0 Compliance Test Softwa

USB Transmitter testing Agilent USB-IF approved compliance test with Matlab scripts NEW: Infiniium 9000 series Oscilloscope N5416A USB 2.0 Compliance

Transmitter electrical test coverage Application automates all compliance tests and provides summary of all testing performed

Connection diagrams and integrated test procedures make setup and execution of testing simple Industries only automated RX test solution Receiver Te

Receiver Jitter tolerance testing • Why Test USB 2.0 jitter tolerance? • The N5990A option 102 provides unprecedented USB 2.0 receiver device test cov

Completing the Solution: Fixtures and probing E2649A High speed USB compliance test fixture set 9000 Series ships standard with N2873A probes E2646A S

• USB 2.0 Basics • Agilent’s USB 2.0 Solution • Design challenges • Common compliance pitfalls • What are Waivers? • Advanced Debug and Testing with t

Design Challenges • HS Signal Integrity – Trace and Driver Impedance – Proper decoupling • Current Draw – Operating current – Unconfigured current – S

USB Impedance Spec Explained • What does the spec say? • High-Speed Zo – Zo – cable = 90 +/-15 % – ZHSTERM = 80 to 100 ohms differential – ZHSTHRU = 7

USB Impedance Measurement • 86100C DCA-J paired with 54754A Differential TDR module USB Connector reference location BGA discontinuity ZHSTERM 10

Outline • USB 2.0 Basics • Agilent’s USB 2.0 Solution • Design challenges • Common compliance pitfalls • What are Waivers? • Advanced Debug and Testin

Proper Decoupling • Prevent signal integrity problems by understanding how to properly decouple power and grounds on your chip • Bulk vs filter capac

Proper Cap Selection and routing • Proper route/placement of capacitors • Choose the right kind of capacitor depending on it’s purpose – NPO (lowest E

Measuring Device Inrush Current • Inrush is a function of device load on hot attach and hub port voltage/ESR Inrush event time •Spec limit = ~50uC •I

10%-90% variations • As designs move to smaller process technology the edge rates are increasing • USB 2.0 specification limits RT/FT to 500ps as meas

Slew rate RT/FT methodology Design 10-90% Method small ∆V of 10% and 90% = large ∆RT/FT Slew Rate Method Refer to http://compliance.usb.org/index.htm

Test Modes • Test_SEO_NAK • Receiver test mode • Test_J • Test_K • Test_Packet • Other tests driven by HSET using normal USB device requests – Example

• USB 2.0 Basics • Agilent’s USB 2.0 Solution • Design challenges • Common compliance pitfalls • What are Waivers? • Advanced Debug and Testing with t

Compliance Pitfalls • Failure to properly support USB suspend – Low power state required of all devices • < 2.5mA (spec says 500uA = auto waiver) •

Compliance Pitfalls – RX Test •Misinterpretation of RX sensitivity and Squelch requirements has caused considerable confusion and discrepancy in test

Compliance Pitfalls – RX Test Compliance •Agilent uses a histogram function to standardize measurement of sensitivity and squelch thresholds •Other so

Universal Serial Bus (USB) 2.0： • All USB specifications are owned by the USB-IF (Implementers Forum, Inc.) • USB2.0 is an EXTENSION of USB1.1 • USB-I

Receiver Sensitivity (EL_17) and Squelch (EL_16) •Please note that it is the combination of EL_16 and EL_17 that validates the "transmission det

• USB 2.0 Basics • Agilent’s USB 2.0 Solution • Design challenges • Common compliance pitfalls • What are Waivers? • Advanced Debug and Testing with t

Waivers • Some failures are due to measurement errors or non-critical failures • It is important to understand how the USBIF handles some types of fai

Waivers • The criterion for granting a waiver varies greatly and tends to be specific to the device. Some general factors used to consider granting or

Waivers • Products with waivers post to IL and receive logo usage rights • General USBIF rule is waivers are not published • Design to specification

• USB 2.0 Basics • Agilent’s USB 2.0 Solution • Design challenges • Common compliance pitfalls • What are Waivers? • Advanced Debug and Testing with t

USB Protocol Triggering and Decode • Industries first on-scope USB protocol triggering and decode capability • Debug protocol issues • Trigger on dif

Scope: • Up to: 4 GHz BW, 20 GSa/s, 1 Gpts • Powerful triggering • Packed with rich features/analysis. Logic Analyzer: • 16 integrated channels • 128

Debugging multiple bus interfaces • In the past each interface would need to be tested separately often with different types of equipment • Today you

Data read latency shown by read arrows

USB2.0 Basics - Architecture • USB Architecture Host / System Devices Hub Down stream Up stream • Differential Signal • Max USB cable length of 5m •

Advanced protocol triggers for debugging The serial search and real time HW trigger capabilities open a new realm of debug capabilities

Summary • USB compliance testing has grown over the years to address real product problems • Agilent has been a key partner with the USBIF in the grow

Additional Information • Go to www.usb.org to get additional information on certifying your USB products • For specific updates to compliance requirem

Miscellaneous topics • Workshops – Very good place for hands on training – Talk to experts • USBET – required for compliance, integrated into Agilent’

USB2.0 Basics - Signal Rates & Levels Low Speed Full Speed Hi-SpeedSig Rate 1.5Mbps 12Mbps 480MbpsSig Level 3.3V 3.3V 400mVRise and Fall Times 75n

Host test requirements http://www.usb.org/developers/docs#comp_test_procedures

• With 480Mbps, higher quality electrical signals are essential • The market requires all USB products meet the specification by passing the tests. Th

Compliance Workshop Test Suites • USB 2.0 Interoperability Gold Suite • Interoperability with “gold tree” components • USB Command Verifier • USB 2

Outline • USB 2.0 Basics • Agilent’s USB 2.0 Solution • Design challenges • Common compliance pitfalls • What are Waivers? • Advanced Debug and Testin