Agilent Technologies HFBR 5203 Instrukcja Użytkownika Pobierz pdf (Strona 3)

High Speed Versatile Link Receiver

HFBR-2521, 2522, 2524, 2531, 2532

High Temperature Operating Life Test

A. Demonstrated Performance

Equivalent Device

Test Test Condition Samples Hours Failures

High Temperature T

= 85°C, V

= 5.5 V HFBR-2521 520,000 0

Operating Life 520 units

B. Failure Criteria

Failure has occurred when the unit fails catastrophically.

Notes:

1. The

point

MTTF (representing an estimate of the mean point MTTF) is the total device hours

divided by either the number of failures or unity if there are no failures.

90% confident

MTTF and failure rate represent the minimum level of reliability performance that is

expected from 90% of all samples. This confidence interval is based on the statistics of the

distribution of failures. The assumed distribution of failures is exponential. This particular

distribution is commonly used in describing useful life failures. Refer to MIL-STD-690 for details

of this methodology.

3. 1 FIT = 1 failure per 10

device hours.

Point Typical

[1]

90% Confident

[2]

Ambient Junction MTTF

[1]

FITs

[3]

MTTF

[2]

FITs

[3]

Temperature (°C) Temperature (°C) (hours) ( / 10

hours) (hours) ( / 10

hours)

85 95 520,000 1,900 226,000 4,400

75 85 776,000 1,300 337,000 3,000

65 75 1,180,000 840 512,000 2,000

55 65 1,860,000 540 807,000 1,200

45 55 2,990,000 330 1,300,000 770

35 45 4,980,000 200 2,160,000 460

25 35 8,570,000 120 3,720,000 270

C. Failure Rate Prediction, Receiver ( V

= 5.5 V )

1 2 3 4

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