Agilent Technologies E5503A Podręcznik Użytkownika Strona 148

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Agilent Technologies E5500 Phase Noise Measurement System
7-23
Absolute Measurement Examples
Stable RF Oscillator
5 Test Set Tab
Input Attenuation
LNA Low Pass Filter
•LNAGain
Detector Maximum Input
Levels
Microwave Phase Detector
RF Phase Detector
AM Detector
Ignore out-of-lock conditions
Pulsed Carrier
•DCBlock
Analyzer View
PLL Integrator Attenuation
Auto checked
Auto checked
•AutoGain
•0dBm
•0dBm
•0dBm
Not checked
Not checked
Not checked
Baseband
•0dBm
6 Downconverter Tab The downconverter parameters do not apply to this
measurement example.
7GraphTab
•Title
Graph Type
X Scale Minimum
X Scale Maximum
Y Scale Minimum
Y Scale Maximum
Normalize trace data to a:
Scale trace data to a new
carrier frequency of:
Shift trace data DOWN by:
Trace Smoothing Amount
Power present at input of DUT
Stable RF Oscillator vs Similar Reference Source
Single-sideband Noise
•1Hz
•10E+6Hz
•0dBc/Hz
- 170 dBc/Hz
1 Hz bandwidth
1 times the current carrier frequency
•0dB
•0
•0dB
Table 7-4 Parameter Data for the Stable RF Oscillator Measurement
Step Parameters Data
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