Agilent Technologies E5503A Instrukcja Użytkownika Pobierz pdf (Strona 5)

5

Ability to Test a Wide Range

of Devices

The E5500 series measures the

absolute, single sideband phase noise,

the absolute AM noise, and the low

level spurious signals of a wide range

of one-port production devices with

either CW or pulsed carrier signals:

• VCOs, DROs, and fixed oscillators

• Crystal oscillators and clocks

• High frequency synthesizers

• Low noise DC supplies

Measure AM Noise Directly

The E5500 series can automatically

measure the AM noise of RF and

microwave devices. The internal AM

detector and DC blocking filter pro-

vided within Option 001 measures

AM noise on carriers up to 26.5 GHz.

AM noise of millimeter frequency

devices can be measured at the IF fre-

quency automatically with the internal

IF AM detector provided within the

Agilent 70427A downconverter which

is part of the E5504A/B solutions.

Additive Noise Measurements

to Two-port Devices

The E5500 series also measures the

residual (additive) phase noise, AM

noise, and low level spurious signals

of two-port production devices with

either CW or pulsed carrier signals:

• High power amplifiers

• Frequency dividers

• Frequency multipliers

• Mixers

E5500

Source

under test

Reference

source

Tuning voltage

E5500

Stimulus

source

Power

splitter

Device under test

Phase shifter

E5500

External

noise input

Blocking

capacitor

DC power

supply

under test

Use off-the-shelf RF signal generators or

your own low-noise source as the refer-

ence source.

Measuring noise using the external noise

input port

Residual noise measurement of a two-port device

1 2 3 4 5 6 7 8 9 10 11 12

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