Agilent Technologies Option H48 Multiport Test Set Z5623A Instrukcja Użytkownika Strona 9

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Physical-layer structures have increasingly become the bottleneck in high-speed
digital system performance. As bus speeds, clock speeds, and link speeds all
push past the gigabit-per-second mark, digital data no longer looks like simple
ones and zeros. In fact, digital data begins to exhibit analog behavior such as
reflections from discontinuities, dispersive loss, crosstalk, and EMI radiation
and susceptibility. Analog analysis can be the key to solving such digital
problems as overshoot, undershoot, ringing, rise-time degradation, pulse
droop, dropout, ground bound and eye closure.
As the combination of digital and analog analysis in several modes of operation
becomes more important, the need for multiple test solutions becomes diffi-
cult to manage. A single test solution that can fully characterize high-speed
differential devices while leaving domain and format of the analysis up to
the designer becomes the tool of choice. The four-port network analyzer-based
Physical Layer Test System (PLTS) does just that.
Designing gigabit-per-second devices will require the combination of time-
domain and frequency-domain analysis. The Agilent N1900A series Physical
Layer Test System is the premier signal integrity solution for designing and
validating high-speed differential interconnects. PLTS combines frequency-
domain, time-domain, and eye diagram analysis to provide a comprehensive
view of device performance. With a single setup to your device, you can
measure all transmission and reflection terms for all possible modes of
operation, including single-ended, differential, common, and mixed modes.
N1957A 14 ps (10 MHz to 50 GHz)
E8364B PNA and N4421A Test Set
(4-port/2-channel, 4 receiver)
N1953A 36 ps (10 MHz to 20 GHz)
E8362B PNA and N4419A Test Set
(4-port/2-channel, 4 receiver)
N1948A 80 ps (300 kHz to 9 GHz)
E8358A PNA and N4417A Test Set
(4-port/2-channel, 4-receiver)
Features
Powerful signal integrity analysis
tools include time-domain reflectometry
(TDR), time-domain transmission
(TDT), frequency-domain, and eye
diagram analysis
Completely characterize the single-
ended, differential-mode, common-
mode, and mode conversion behavior
of your device
RLCG parameter extraction allows
creation of accurate transmission line
models for use in simulation programs
such as HSPICE
®
High dynamic range provides a view
into elusive EMI problems that
previously may have
gone undetected
Agilent PLTS systems combine a
vector network analyzer, an external test
set, and software with advanced analysis
tools to provide the highest accuracy pos-
sible for measuring inactive single-ended
or differential physical-layer components
such as back-planes, high speed serial
cables, interconnects, and packages.
For more information:
http://www.agilent.com/find/plts
Physical Layer Test Systems (PLTS)
Physical layer test system (PLTS)
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