www.agilent.com/comms/lightwave
Source Modules
Agilent 8198xA and 8194xA Compact Tunable Laser Source
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Modular design for multichannel platform
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110 nm coverage in one module
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Device characterization at high power levels +13 dBm
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SBS suppression feature enables high launch power
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Built-in wavelength meter for active wavelength control
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Dynamic power control for excellent repeatability
High Power Compact Tunable Lasers for S-, C- and L-band
The Agilent 819xxA compact tunable laser sources supply an output
power of up to +13dBm. Each module covers a total wavelength range
of 110nm, either in the S+C-band with the high power in C (81980A
and 81989A), or in the C+L-band with the high power in the L-band
(81940A, 81944A, 81949A).
Device Characterization at High Power Levels
The high optical output power of the 819xxA tunable lasers enhances test
stations for optical amplifier, active components and broadband passive
optical components. It helps overcome losses in test setups or in the device
under test itself. Thus, engineers can test optical amplifiers such as EDFAs,
Raman amplifiers, SOAs and EDWAs to their limits. These tunable lasers
provide the high power required to speed the development of innovative
devices by enabling the test and measurement of nonlinear effects.
Stimulated signal spectrum with one controlling channel of tunable laser source
SBS Suppression Feature Enables High Launch Power
The new SBS-suppression feature prevents the reflection of light induced
by Stimulated Brillouin Scattering (SBS). It enables the launch of the high
power into long fibers without intensity modulation, which is detrimental
in time-domain measurements.
Compact tunable laser source with dual power meter in one box
Coherence Control Reduces Interference-Induced
Power Fluctuations
A high-frequency modulation function is used to increase the effective
linewidth to reduce power fluctuations caused by coherent interference
effects. The modulation pattern is optimized for stable power
measurements even in the presence of reflections.
Internal Modulation
The internal modulation feature enables an efficient and simple
time-domain extinction (TDE) method for Erbium-based optical
amplifier test when used together with the external gating feature
of the Agilent OSA. It also supports the transient testing of optical
amplifiers by simulating channel add / drop events.
Cost Effective Passive Component Test
Agilent’s compact tunable laser sources provide excellent wavelength
and power accuracies to enable reliable swept wavelength measurement
for passive component test in a cost effective way. The built-in wavelength
meter with a closed feedback loop for enhanced wavelength accuracy
allows dynamic wavelength logging in continuous sweep mode.
The integrated dynamic power control loop guarantees highly
repeatable measurements.
Laser characteristics in long fiber with and without SBS suppression
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