Agilent Technologies 8510C Dokumentacja

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Strona 1 - Network Analyzer

Agilent PN 8510-18Testing amplifiers and activedevices with the Agilent 8510CNetwork AnalyzerProduct Note

Strona 2 - Table of Contents

10Figure 7. Input SWR measurementFigure 8. Complex output impedance measurementReturn loss, SWR, and reflection coefficientReturn loss (RL), standing

Strona 3 - Introduction

The power flatness calibration feature of the 8510Cnetwork analyzer provides a more precise powerlevel to the AUT. A 437B or 438A power meter andan ap

Strona 4 - Amplifier parameters

126. When the calibration is complete, activate flat-ness correction.[PRIOR MENU]{FLATNESS ON}7. Verify the constant power level at the test portby us

Strona 5 - Measurement setup

13The Agilent 8510C has the capability to makemeasurements of amplifiers operating in their non-linear region. A swept-frequency gain compressionmeasu

Strona 6 - Measurement examples

14Figure 13. Swept power gain compression measurementSwept-power gain compressionBy applying a fixed-frequency power sweep to theinput of an amplifier

Strona 7 - Linear measurements

15Custom test set configurationsThe Agilent 85110 test set provides the greatestflexibility for the testing of high-power amplifierswhich often requir

Strona 8 - Deviation from linear phase

16Figure 15. Block diagram for special high-power test setconfiguration for the 85110Figure 14. 85110 simplified block diagram▲▲▲▲▲▲▲▲▲▲▲▲▲▲▲▲▲▲▲▲▲Fou

Strona 9 - Group delay

17Error correction can be applied to the measure-ments discussed in this note to reduce the meas-urement uncertainty. A full two-port calibrationwas u

Strona 10 - Complex impedance

18Reflection measurementsThe uncertainty of a reflection measurement suchas return loss, SWR, reflection coefficient andimpedance is affected by direc

Strona 11 - Power flatness correction

19Appendix C—8360 series synthesized sweepers maximum leveled power (dBm)83620A/Frequency 83621A 83623A 83631A 83651A20 GHz +10 +17 +10 +1026.5 GHz —

Strona 12 - Absolute output power

23 Introduction4 Amplifier parameters5 Measurement setup7 Linear measurements11 Power flatness correction13 Nonlinear measurements15 Appendix A—High p

Strona 13 - Nonlinear measurements

20Appendix D—Optimizing power sweep rangePower sweep range will be reduced if a power flat-ness correction is used in combination with powersweep. If

Strona 14 - Swept-power gain compression

21The following example program demonstrates thismethod.10 ! RE-SAVE “POW_OFFSET”20 ! 30 ! This program calculates and removes the averageamplitude co

Strona 15

700 MAT Diff= Flat_on-Flat_off ! Diff(*) = source flatnesscorr array710 Offset=SUM(Diff)/(Bytes/16) 720 MAT Diff(*,1)= Diff(*,0) ! Diff(*,1) = flatnes

Strona 16

Input matchInput return lossInput SWRInput reflection coefficientInput impedanceOutput matchOutput return lossOutput SWROutput reflection coefficientO

Strona 17 - Transmission measurements

4Parameter Equation DefinitionGain VtransThe ratio of the amplifier’s output power (delivered to a ZOload) to the input power(delivered from a τ = ___

Strona 18 - Reflection measurements

5Measurement setupTable 2. Allowable input power to network analyzer8514B at 8515A at 8517B at20 GHz 26.5 GHz 50 GHz0.1 dB compression level for + 8.

Strona 19

63. Power meter calibration (optional)The 8510C network analyzer provides leveledpower at the test set port with a specified varia-tion of less than 2

Strona 20

7Measurements in the linear operating region of theamplifier can be made with the 8510C by using thebasic setup shown in Figure 2. Care must be takenw

Strona 21

83. Measure the gain flatness or variation over afrequency range using the following sequence.First, set the appropriate start/stop or center/spanfreq

Strona 22 - 5963-2352E

92. Place a marker in the center of the band andactivate the electrical delay feature,[MARKER] {MARKER 1} {12 GHz}RESPONSE [MENU] {COAXIAL} OR {WAVEGU

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