Agilent Technologies 3070 Instrukcja Użytkownika Pobierz pdf

The Agilent Medalist i3070 Series 5 In-Circuit Test (ICT) system introduces

a new infrastructure with 3 new Capabilities:

1) The flexibility to incorporate external circuits to balance between ICT &

functional testers and reduce investment on functional testers

2) Wider range of power handling capabilities for today’s high-powered

products to reduce investment on power supply hardware

3) Improved test throughput to increase production volumes, making more

tester resources available

The Series 5 – Saves Costs. No Compromise.

Agilent Medalist i3070 Series 5

In-Circuit Test System

Data Sheet

The Agilent Medalist i3070 Series 5

In-Circuit Test System comes with

industry-leading limited access test

technology, including the multiple-award-

winning Cover-Extend Technology

1 2 3 4 5 6 7 8

Podsumowanie treści

Strona 1 - In-Circuit Test System

The Agilent Medalist i3070 Series 5 In-Circuit Test (ICT) system introduces a new infrastructure with 3 new Capabilities:1) The flexibility to incorpo

Strona 2 - New Analog Measurement Card

2Latest Features on the Series 5 ICT SystemNew Analog Measurement CardThe new Analog Stimulus and Response Unit (ASRU) includes 1. BT-Basic DLL Integr

Strona 3

3Latest Features on the Series 5 ICT SystemIncorporating External ElectronicsThis capability is enabled through both hardware and software features ad

Strona 4 - Related Agilent Literature

4Latest Features on the Series 5 ICT SystemSoftware EnhancementThe Series 5 also includes software and enhancements listed below, and retains all the

Strona 5 - Specifications

5SpecificationsAgilent Medalist i3070 Series 5 MultiplexedAgilent Medalist i3070 Series 5 Un-multiplexedMaximum channels 1152 5184Maximum nodes 5184 5

Strona 6

6Agilent Medalist i3070 Series 5 MultiplexedAgilent Medalist i3070 Series 5 Un-multiplexedSystem power input connections Included (power supply type w

Strona 7

7SpecificationsAgilent Medalist i3070 Series 5 MultiplexedAgilent Medalist i3070 Series 5 Un-multiplexedSoftware productsTest development software bun

Strona 8

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