Agilent Technologies B1500A Instrukcja Obsługi Strona 108

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Module 6
Low Current Measurement
6-36
Low Current Gate Oxide Measurement
Fowler-Nordheim (FN) Plot
The Fowler-Nordheim (FN) plot is a log plot of oxide leakage in accumulation mode breakdown.
The plot shows a characteristic "arc" leading up to the rupture current.
This plot is a measurement result example of a MOS capacitor on a wafer. You cannot get this kind
of plot by measuring the class exercise MOS FET.
The MARKER is set to -27.590 mA. This is the point at which rupture of the gate oxide occurred.
The B1500A has the sweep abort function which automatically aborts sweep measurement when any
abnormal occurs.
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