Agilent Technologies 54657A Podręcznik Użytkownika Pobierz pdf (Strona 58)

Creating a delay testing mask

A mask can be used to test the channel to channel delay of two input signals.

The shape of the mask varies depending on the channel 2 edge selected (stop

edge). Different masks are needed for different edge selections.

To test the channel to channel delay of the signal connected to channel 2, the

stop edge of the signal is tested instead of actually measuring the delay. The

test can be conducted by triggering on the start edge (channel 1), and testing

for the location of the stop edge (channel 2). An example mask is shown in

the following figure.

Example of a mask template used in channel to channel delay

Figure 2– 13

Operating the Measurement/Storage Module

Creating a delay testing mask

2–42

1 2 ... 53 54 55 56 57 58 59 60 61 62 63 ... 88 89

Brak uwag

Agilent Technologies 54657A Podręcznik Użytkownika Strona 58