Agilent Technologies N5416A Instrukcja Obsługi Strona 175

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Agilent Technologies
175
N5416A USB 2.0 Compliance Test Option
Notes on Electrical Testing
6
Troubleshooting Hi-Speed Test Failures
In the Configure tab’s Debug Mode, there are several options that can help
you troubleshoot hi- speed test failures:
Marker Placement — Lets you manually adjust the markers around the
required packet/pattern before proceeding with the test analysis. When
“MANUAL” is selected, the automated search for the correct
pattern/packet to analyze is turned off.
Data Eye Test Mode — Lets you perform the eye test without using the
MATLAB scripts. The oscilloscope will form the eye diagram using the
E2688A serial data analysis (SDA) and clock recovery software option.
Figure 3 Debug Mode Options for Hi-Speed Testing
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