Agilent Technologies 346C Instrukcja Użytkownika
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- Strona / 57
- Spis treści
- BOOKMARKI
- Advancements in Noise 1
- Measurement 1
- Objectives 2
- Objectives (cont) 3
- The Early Days 4
- Agilent’s Noise Figure Legacy 5
- Definition 6
- Noiseless 9
- ≡ minimum noise factor 10
- ≡ noise resistance 10
- Noise source 11
- 346C 10 MHz – 26.5 GHz 11
- IEEE IMS SCV Chapter Mtg 12
- May 21, 2008 12
- RECEIVER 13
- EuMw 2007 Agilent Workshop 15
- Cold Noise Source Technique 17
- T ~ 10,000K 18
- Noise Parameters 19
- Increasing noise figure 22
- Measuring Noise parameters 23
- New Noise Measurement System 27
- ECal as Noise Tuner 28
- Calibration of the receiver 30
- 5 unknowns, linear equation 30
- Calibration of receiver 31
- - solution of equations 31
- Settings 32
- Noise Measurement Softkeys 34
- Noise Set Up 35
- Noise Cal 38
- Measurement of DUT 42
- 4 unknowns, linear equation 42
- 60 µm FET 45
- Measurements Compared 46
- (ATE Setup) 47
- (Wafer Setup) 48
- Verification approach 49
- Noise Figure 55
- Additional References: 56
- Noise Option Block Diagram 57
Podsumowanie treści
IEEE IMS SCV Chapter MtgMay 21, 2008Page 1Advancements in Noise MeasurementbyKen Wong, Senior Member IEEER&D Principal EngineerComponent Test Divi
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