Agilent Technologies 75000 SERIES B Dokumentacja Pobierz pdf (Strona 20)

±(0.2%-of setting + 0.1%-of range)

V/s (at threshold point)

Definition of Measurement Error Sources and Terms

used in Calculations continued

Phase Noise and Allan Deviation

The input signal’s jitter spectrum (Phase noise) and low-frequency wander char-

acteristics (Allan variation) will limit the achievable measurement resolution and

accuracy. The full accuracy and resolution of the counter can only be achieved

when using a high-quality input signal source or by externally filtering the input

signal to reduce these errors.

Threshold level setting error (T

LSE

)

Threshold level setting error (T

LSE

) is the uncertainty in the actual signal thresh-

old point due to the inaccuracies of the threshold circuitry.

Slew rate (SR)

Slew rate (SR) describes the input signal’s instantaneous voltage rate of change

(V/s) at the chosen threshold point at customer BNC.

For sine wave signals, the maximum slew rate SR= 2πF*V

0 to PK

For Square waves and pulses, the max slew rate = 0.8 Vpp/ t

RISE 10-90

Using the 100 kHz low pass filter will effect Slew Rate.

Signal noise (E

)

The input signal RMS noise voltage (E

) measured in a DC - 350 MHz bandwidth.

The input signal noise voltage is RSS combined with the instruments equivalent

input noise voltage when used in the Threshold Error (T

)

calculation.

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Agilent Technologies 75000 SERIES B Dokumentacja Strona 20